EasyManua.ls Logo

Hioki IR4055 - Appendix; Appx. 1 Measurement Principles

Hioki IR4055
88 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
Appx.1
Appendix
Appx. 1 Measurement Principles
1. Insulation resistance measurement
The measuring object’s insulation resistance Rx is calculated by applying a
voltage V to the object, measuring the leak current I that ows to the object as
a result, and dividing the voltage V by the leak current I.
2. Low resistance measurement (IR4056, IR4057-50)
The measuring object’s resistance Rx is calculated by applying a current I
to the measuring object, measuring the voltage V that occurs between the
measurement terminals as a result, and dividing the voltage V by the current I.
3. PV
Ω
measurement (IR4053, IR4055)
The resistance Rx is calculated using the equation (Applied voltage V)/
(Leakage current I) by applying a voltage V to the measuring object, and then
measuring the leakage current I owing through the measuring object and
applied voltage V. (Voltage and current generated from the measuring object
are subtracted.)
Appendix
1
2
3
4
5
6
7
Appx.
索引
HIOKI IR4057B961-00

Related product manuals