NFS-320 and NFS-320SYS UL Listing Document — P/N 52745LD:G9 5/19/2022 35
Advanced Walk Test
During Advanced Walk Test, when the tester activates an input, all CBE mapped to that input will activate with the exception of releasing functions.
Each input activation is latching; that is, it will not deactivate until the system is reset. Advanced Walk Test will sound all activated outputs, overriding
a setting of “*” (silent) in the Walk Test field.
Enter Advanced Walk Test as follows:
Enter LTEST at the password screen. Asterisks will display where LTEST has been typed. Pressing
ENTER displays the following
screen.
Advanced Walk Test directs the control panel to do the same as it does for Basic Walk Test with the following exceptions:
• alarm and trouble messages are sent to the printer, not test messages. (These Walk Test messages can be distinguished from others at the printer
because they begin with the trouble message generated when Walk Test is entered, and end with the cleared trouble when Walk Test is exited.)
• all CBE mapped to the test input is activated except releasing functions.
Walk Test Activation Indications
FlashScan poll mode - Once the test is started:
• each intelligent addressable input device will blink its address in red, and each intelligent addressable output device will blink its address in green.
Pattern examples are given below.
• an input device activated in Basic Walk Test latches on steady green for the duration of the test.
• an output device activated in Basic Walk Test will remain active and the LED will glow steady green for:
– approximately 4 seconds for alarms
– approximately 8 seconds for troubles.
• an output device activated in Advanced Walk Test will remain active and the LED will glow steady green until the reset key is pressed.
CLIP mode
- Once the test is started:
• intelligent addressable input and output devices continue to blink red as usual until activated.
• an input device activated in Basic Walk Test latches on steady red during activation. If the device is put in trouble (for instance, the detector head
is removed, then replaced), the LED will be latched on for the duration of the test.
• an output device activated during Basic Walk Test will remain active and the LED will glow steady green (if a FlashScan module) or steady red
(if a CLIP module) for:
– approximately 4 seconds for alarms
– approximately 8 seconds for troubles
• an output device activated in Advanced Walk Test will remain active and the LED will glow steady green (if a FlashScan module) or steady red
(if a CLIP module) until the reset key is pressed.
Viewing Walk Test Results
When finished with a Walk Test, view the History buffer, installed printers and CRT-2s to check the results of the Walk Test. View the History buffer
by using the Read Status function. From the SYSTEM NORMAL screen, press the
ENTER key, press the 2 key two times, then press the ENTER key to
view the History buffer.
Battery Checks and Maintenance
Maintenance-free sealed lead-acid batteries used in the system do not require the addition of water or electrolyte. These batteries are charged and
maintained in a fully charged state by the main power supply’s charger during normal system operation. A discharged battery typically reaches the
voltage of 27.6 VDC within 48 hours; the charge rate depends on the battery size (2.0A for 18-26AH; 5.0A-5.7A for 26AH-200AH).
NOTE: Some detectors, laser detectors for example, can be difficult to place in alarm using a magnet. Advanced Walk Test facilitates magnet
testing of these detectors.
NOTE: The control panel can not be put into Walk Test from an alarm condition.
To Press
Stop an Advanced Walk Test and return to the “Status Change Selection” screen
Address
Blink Pattern
8 8 blinks, long stop, 8 blinks, long stop,....
37 3 blinks, stop, 7 blinks, long stop, 3 blinks, stop, 7 blinks, long stop,....
70 7 blinks, stop, 10 blinks, long stop, 7 blinks, stop,.....
107 10 blinks, stop, 7 blinks, long stop, 10 blinks, stop,.....
152 15 blinks, stop, 2 blinks, long stop, 15 blinks, stop, 2 blinks, long stop....
TROUBL IN SYSTEM ADV WALK TEST
PROCESSING DISABLED 10:07a 041508 MON
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