Jasco V-650 - V-650 Spectrophotometer Specs

7
2.2 V-650 UV/VIS Spectrophotometer Specifications
Optical system Single monochromator
UV/VIS region: 1200 lines/mm plane grating
Czerny-Turner mount
Double beam type
Light source Deuterium lamp: 190 to 350 nm
Halogen lamp: 330 to 900 nm
Light source exchange
wavelength
Any wavelength between 330 and 350 nm can be
selected.
Detector Photomultiplier tube
Wavelength range 190 to 900 nm
Wavelength accuracy
±0.2 nm (at a spectral bandwidth of 0.5 nm, wavelength:
656.1 nm, when the room temperature is stabilized.)
Wavelength repeatability
±0.05 nm
Slew speed 12000 nm/min
Spectral bandwidth 0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L2, L5, L10 nm (low stray-light mode)
M1, M2 nm (micro-cell mode)
Photometric range 0 to 10000 %T
-2 to 4 Abs
Photometric accuracy
±0.002 Abs (0 to 0.5 Abs)
±0.003 Abs (0.5 to 1 Abs)
±0.3 %T
(Tested with NIST SRM 930D)
Photometric repeatability
±0.001 Abs（0 to 0.5 Abs）
±0.001 Abs（0.5 to 1 Abs）
Stray light 1 % (198 nm KCL 12g/L aqueous solution)
0.005 %(220 nm NaI 10g/L aqueous solution)
0.005 %(340 nm NaNO
2
50g/L aqueous solution)
0.005 %(370 nm NaNO
2
50g/L aqueous solution)
(spectral bandwidth: L2 nm, 10 mm cell used)
Baseline stability 0.0003 Abs/hour
(value obtained more than two hours after turning on the
light source, when the room temperature is stabilized,
wavelength: 250 nm, response: slow, and spectral
bandwidth: 2nm.)
Baseline flatness
±0.0003 Abs
(value obtained after baseline correction with a
temperature variation of less than 5°C, wavelength: 200
to 850 nm, response: medium, spectral bandwidth: 2 nm,
and wavelength scanning speed: 400 nm/min with
smoothing processing)
RMS noise 0.00003 Abs (0 Abs, wavelength: 500 nm, measurement
time: 60 sec, response: medium, spectral bandwidth: 2
nm)
Power requirements
100, 115, 200, 220, 230, 240 V ±10 %, 145 VA
Dimensions and weight
270(H) ´ 460(W) ´ 602(D) mm (excluding protrusions)
27 kg
Note: Values given for wavelength accuracy, wavelength repeatability, photometric
accuracy, photometric repeatability, baseline flatness, and RMS noise are
those obtained more than one hour after the light source was turned on.