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Chapter 6 Disassembly and Repair
Self-Test Procedures
6
Self-Tests
A complete self-test performs the following tests. A failing test is
indicated by the test number and description in the display.
601 Self-test failed; system logic
This error indicates a failure of the main processor, system RAM, or
system ROM.
603 Self-test failed; waveform logic
This error indicates that the waveform logic in the synthesis IC has
failed.
604 Self-test failed; waveform memory bank
This error indicates either the waveform RAM or the synthesis IC has
failed.
605 Self-test failed; modulation memory bank
This error indicates the modulation memory bank in the synthesis IC
has failed.
606 Self-test failed; cross-isolation interface
This error indicates that the cross-isolation interface between the main
processor and Synthesis IC has failed, or that the synthesis IC itself has
failed.
619 to 621
623 to 625
619: Self-test failed; leading edge DAC
620: Self-test failed; trailing edge DAC
621: Self-test failed; square-wave threshold DAC
623: Self-test failed; dc offset DAC
624: Self-test failed; null DAC
625: Self-test failed; amplitude DAC
These errors indicate a malfunctioning system DAC, or failed DAC
multiplexer channels.
622 Self-test failed; time base calibration DAC
This error indicates that the time base calibration DAC in the synthesis
IC, or voltage controlled oscillator has failed.
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