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LeCroy Waverunner2 LT374M User Manual

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LTXXX2-SM-E
LeCroy Waverunner2 Series
Service Manual
Version D- December 2003
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LeCroy Waverunner2 LT374M Specifications

General IconGeneral
Bandwidth500 MHz
Sample Rate2 GS/s
Channels4
Vertical Resolution8 bits
Input CouplingAC, DC, GND
Display10.4" Color LCD
Input Impedance1 MΩ
Maximum Input Voltage400 V
Trigger ModesEdge, Pulse Width, TV, Logic, Dropout, Interval
InterfaceGPIB, USB

Summary

Warranty and Product Support

1.1 Warranty

Covers product warranty terms, duration, and conditions for LeCroy oscilloscope products.

1.2 Product Assistance

Information on obtaining help for installation, calibration, and usage of LeCroy equipment.

1.3 Maintenance Agreements

Details LeCroy's customer support services and extended warranty options.

1.4 Staying Up to Date

Explains LeCroy's commitment to product refinement and potential documentation discrepancies.

1.5 Service and Repair

Procedures for returning products for maintenance and repair services.

1.6 How to return a Product

Steps and information required for returning products for service, including RAN.

1.7 What Comes with Your Scope

Lists the standard accessories shipped with the oscilloscope.

General Information

2.1 Product Assistance

Contact points for installation, calibration, and usage support.

2.2 Installation for Safe and Efficient Operation

Specifies operating environment parameters like temperature, humidity, and altitude.

Specifications

3.1 Models

Lists the different Waverunner2 series models and their channel configurations.

3.2 Vertical System

Details specifications for bandwidth, impedance, sensitivity, and resolution.

3.3 Timebase System

Covers timebase ranges, clock accuracy, and interpolator resolution.

3.4 Acquisition System

Provides details on sample rates and maximum acquisition points per channel.

3.5 Acquisition Modes

Describes acquisition modes like RIS, Single Shot, and Sequence Mode.

3.6 Acquisition Processing

Explains Averaging, Enhanced Resolution (ERES), and Envelope functions.

3.7 Triggering System

Details trigger modes, sources, coupling, and delay parameters.

3.8 Automatic Setup

Features for automatic timebase, trigger, and sensitivity adjustment.

3.9 Probes

Information on probe system compatibility and scale factors.

3.10 Color Waveform Display

Describes display type, resolution, screen saver, and trace options.

3.11 Analog Persistence Display

Covers analog and color graded persistence settings and trace display.

3.12 Zoom Expansion Traces

Details vertical and horizontal zoom capabilities, and autoscroll function.

3.13 Rapid Signal Processing

Information on processor, processing memory, and real-time clock.

3.14 Internal waveform Memory

Specifies waveform and zoom/math trace storage capabilities.

3.15 Setup Storage

Describes setup storage options including non-volatile memories and floppy drive.

3.16 Interface

Lists available interfaces like GPIB, RS-232-C, Ethernet, and ports.

3.17 Outputs

Details calibrator signal and control signal outputs.

3.18 Environmental and Safety

Specifies operating conditions, CE approval, and UL/cUL certifications.

3.19 General

Covers auto calibration, power requirements, battery backup, and warranty.

3.20 Physical Dimensions

Provides physical dimensions and weight specifications.

3.21 Math Tools (Standard)

Lists standard math functions available for signal processing.

3.22 Measure Tools (Standard)

Lists standard measurement parameters like amplitude, frequency, and delay.

3.23 Pass/Fail

Describes limit testing using masks and setting pass/fail conditions.

3.24 Options

Mentions extended math and measurement options.

3.25 Extended math tools

Lists additional math tools like absolute value, differentiate, and exponential functions.

3.26 Cursor Measurements

Details cursor measurements for relative and absolute time/voltage.

3.27 Extended Measure Tools

Lists extended measurement tools such as cycle median and time difference.

3.28 WaveAnalyzer

Introduces WaveAnalyzer capabilities for FFT, averaging, and histograms.

3.29 WaveAnalyzer Tools (Standard)

Describes standard WaveAnalyzer tools like histograms and FFT power averaging.

3.30 Other Application Solutions Available

Lists available application solutions like JTA, DFP, and PMA.

3.31 Free Software Utilities

Mentions free software utilities like ScopeExplorer and MaskMaker.

3.32 Basic Triggers

Covers basic trigger types like Edge, Slope, Window, and Line.

3.33 SMART Trigger Types

Details SMART trigger types including State/Edge, Dropout, Pattern, and TV.

3.34 SMART Triggers with Exclusion Technology

Explains SMART triggers for signal/pattern width, interval, and slew rate.

3.35 Hardcopy

Describes hardcopy functions, supported printers, and formats.

3.36 Waveform Output

Covers waveform saving to disk and output formats.

3.37 Documentation

Lists the documentation included with the oscilloscopes, including manuals and software utilities.

Theory of Operation

4.1 Processor Board

Describes the MPC603e processor, its architecture, and power supply requirements.

4.2 Main Board

Details the main board structure, including front end, ADC, trigger, and timebase components.

Performance Verification

5.1 Introduction

Explains the purpose of performance verification procedures and traceable calibration.

5.1.1 List of Tested Characteristics

Lists quantifiable performance limits that are tested for verification.

5.1.2 Calibration Cycle

Recommends annual calibration for the oscilloscope under normal use conditions.

5.2 Test Equipment Required

Lists external test equipment needed for performance verification procedures.

5.3 Turn On

Basic instructions for powering on the oscilloscope and waiting for stabilization.

5.4 Input Impedance

Details the procedure for measuring input impedance using a high-precision digital multimeter.

5.4.1 Channel Input Impedance

Specifies steps for testing DC and AC 1MΩ input impedance on channels.

5.5 Leakage Current

Describes the test procedure for measuring leakage current across input channels.

5.5.1 Channel Leakage Current

Specifies steps for measuring channel leakage current using a DMM.

5.6 Noise

Explains noise testing procedures with open inputs across different settings.

5.6.1 Rms Noise

Defines test limits and the procedure for measuring RMS noise.

5.7 DC Accuracy

Details the procedure for measuring DC accuracy at 0V offset setting.

5.8 Offset Accuracy

Describes the test procedure for offset accuracy at 5mV/div with a ±1 Volt signal.

5.9 Bandwidth

Explains the purpose of bandwidth testing and the required external source.

5.10 Trigger Level

Explains testing trigger capabilities for standard edge trigger cases.

5.10.1 Channel Trigger at 0 Division Threshold

Details channel trigger testing at 0 division threshold with DC coupling.

5.10.2 Channel Trigger at +3 Divisions Threshold

Details channel trigger testing at +3 divisions threshold with DC coupling.

5.10.3 Channel Trigger at −3 Divisions Threshold

Details channel trigger testing at -3 divisions threshold with DC coupling.

5.10.4 External Trigger at 0 Division Threshold

Details external trigger testing at 0 division threshold with DC coupling.

5.10.5 External Trigger at +3 Divisions Threshold

Details external trigger testing at +3 divisions threshold.

5.10.6 External Trigger at −3 Divisions Threshold

Details external trigger testing at -3 divisions threshold.

5.10.7 External/10 Trigger at 0 Division Threshold

Details external/10 trigger testing at 0 division threshold with DC coupling.

5.10.8 External/10 Trigger at +3 Divisions Threshold

Details external/10 trigger testing at +3 divisions threshold.

5.10.9 External/10 Trigger at −3 Divisions Threshold

Details external/10 trigger testing at -3 divisions threshold.

5.11 Smart Trigger

Introduces smart trigger functionality for pulse width detection.

5.11.1 Trigger on Pulse Width 10 nsec

Details testing trigger on pulse widths less than and greater than 10 nsec.

5.11.2 Trigger on Pulse Width 100 nsec

Details testing trigger on pulse widths less than and greater than 100 nsec.

5.12 Time Base Accuracy

Explains the procedure for testing time base accuracy using a sine wave generator.

Maintenance

6.1 Introduction

Introduces the maintenance section covering maintenance, calibration, and troubleshooting.

6.1.1 Safety Precautions

Details safety warnings for personal injury and instrument damage during servicing.

6.1.2 Antistatic Precautions

Outlines precautions against static electricity to protect components during handling.

6.2 Software Update Procedure

Explains firmware upgrading via floppy disk or memory card interface.

6.2.1 Upgrading Firmware

Details the steps for performing firmware updates from floppy and card media.

6.2.2 Software Options

Lists available software options like EMM, WAVA, MC01, and JTA.

6.2.2.1 Changing Software Option Key

Explains how to change software options by entering an option key.

6.3 Equipment and Spare Parts Recommended for Service

Lists required test equipment and spare parts for service.

6.3.2 LT Series Spare Parts

Provides a table of LT Series spare parts with part numbers and assembly details.

6.4 Board Exchange Procedure

Details procedures for exchanging processor and main boards.

6.4.1 Processor Board Exchange Procedure

Explains how to load the serial number into a new processor board.

6.4.2 Main Board Exchange Procedure

Describes the method for adjusting after exchanging the main board.

6.4.3 Power Board Exchange Procedure

Outlines the procedure for confirming voltages after power board exchange.

6.5 Troubleshooting and Flow Charts

Introduces troubleshooting information for qualified personnel and lists common symptoms.

6.5.2 Line Fuses Replacement

Details how to replace line fuses, including part numbers and procedures.

6.5.3 Initial Troubleshooting Chart

Guides troubleshooting down to the board level and refers to service offices.

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