National Instruments PXI User Manual

NI 5114 Calibration Procedure | © National Instruments | 31
11. Repeat steps 11. a through 11. e for each Input Frequency in the current iteration.
a. Configure the calibrator to output the Input Frequency listed in Table 9 for the current
iteration.
b. Wait 2,500 ms for the impedance matching and frequency of the calibrator to settle.
c. Initiate a waveform acquisition using the niScope Initiate Acquisition VI.
d. Fetch a waveform from the device and perform a voltage RMS measurement using the
niScope Fetch Measurement (poly) VI. Select the Measurement Scalar DBL instance
of the VI. This value is the Measured RMS Voltage of Generated Sine Wave used in
step 11. e.
e. Calculate the power difference using the following formula:
power = (20log
10
a) - (20log
10
b)
where
a is the Measured RMS Voltage of Generated Sine Wave
b is the Measured RMS Voltage of 50 kHz Sine Wave
If the result is within the test limits in Table 9, the device has passed this portion of the
verification.
12. Repeat steps 2 through 11 for each iteration in Table 9.
13. Move the calibrator test head to the device input channel 1 and repeat steps 2 through 12,
changing the value of the channelList parameter from
"0" to "1".
LabVIEW VI C/C++ Function Call
Call niScope_Initiate
Acquisition
with the
following parameter:
vi: The instrument handle from
niScope_init
LabVIEW VI C/C++ Function Call
Call
niScope_FetchMeasureme
nt
with the following
parameters:
timeout: 1.0
vi: The instrument handle from
niScope_init
channelList: "0"
scalarMeasFunction:
NISCOPE_VAL_VOLTAGE_RM
S

National Instruments PXI Specifications

General

Number of Slots	Varies by chassis (4, 8, 18)
Power Supply	Varies by chassis (typically AC or DC input)
Operating System Support	Windows, Linux
Typical Applications	Automated test, data acquisition
Compatibility	PXI
Cooling	Forced air
Operating Temperature	0 °C to 55 °C (Varies by module and chassis)
Relative Humidity	10% to 90% noncondensing (Varies by module and chassis)