Tektronix 7704A User Manual

Ci r cu it Description -7704A Service
VER TICAL SIG N A L
FR
O
M T
R IGG
ER
S ELE CTO R CI R C U IT
D
EL AY E D GATE
F R O M MAIN
I N T ERF AC E
CI
R C U IT
Α SA W
TOOT H
FR O M ΜΑΙΝ --
I N T ERF AC E CI R C U IT
Β
5 Α
W
ΤΟΟΤΗ
FRON\ MAIN
INTERFACE CIRCUIT
AGATE FR O M MAIN

 ;
INT
ERF AC
E CI
R C
U IT
Β GATE FR
O
M MAIN
I N T
ER
F ACE CI R C U IT
SWEEP
S ELE CTO R
ment is connected to
t h e b ase of emitter-follower Q3351 .
T h e base of Q3353 is
connecte d
to
gro u nd by S3340 so t h e
circuit operates as α
commo n - b ase stage . Q3351 pr ovides α
h ig h inp u t
impeda n ce for t h e stage w h ile t h e emitter
co
u pling b etween t h e transistors provi d es tem p erature
compe n satio n . O p e r ation is t h e same in t h e
Β
position of
t h e Gate Selector switc h , except t h at t h e Gate signal from
t h e Β ΗΟ R ΙΖ com p artme n t p r ovides t h e i np ut signal
.
In t h e Dly'd position, t
h
e Gate
Selector switc h connects
t h e b ase of 03351 t
hr
o
u g h R 3349 to gro u nd an d
2- 32
VER
TICA L SIG N A L A MPL I F I ER
400(~
Οί 3306 -Q3308-
43312- Q3315
SA W
TOOT
H A
MP
LI
F I
ER
- ~Q9321 - β 3323 -
03330
F ig .
2-28 . O u t pu t Sig n als d etailed b loc k d iag
r a m .
533 ό8
RE
ADO U
T
MOD E
ι
GAT E A MPL
I
F I E R
Q3351 - 43353 - Q39 (0
1
VER T SIG O U
T
+5
Α W τ
00 ΤΗ
ο U
Τ
RE
ADO U T M OD E
IN- TO
READOUT
SYST
EM
RE ADO U T
CONT R O L
β
330507
) QS373
I+ GATE OUT I
d isconnects t
h e Α Gate a nd Β Gate signals . T h e ot h er
sectio n of t
he Gate Selector switc h opens to allow the
Delayed Gate
sig n al from t he d elaying time-base u n it to
reac
h
t
h e b ase of Q3353 . Q3353 inverts t h is n
egative-going
Delaye d Gate sig n al so t h at all t h ree gate signals at
t h e +
GAT E O U T connector are positive going .
C R3361 provides tem
p
erature
com
p ensation for Q3361 .
C R 3363 p rotects Q3361 if α h ig h -level p ositive voltage is
applied to t
h e + GAT E O U T connector, and C R 3364

Tektronix 7704A Specifications

General

Brand	Tektronix
Model	7704A
Category	Test Equipment
Language	English