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Specifications

1-12

TDS5000B Series Specifications and Performance Verification

Table 1- 2: Channel input and vertical specifications (Cont.)

Characteri sti c Description

Effective bits, typical Sine wave input at the indicated f requency and pk-pk amplitude, 50 mV/div

and 25 °C

Signal and input conditions Effective bits

TDS5032B, TDS5034B, TDS5052B,

TDS5054B, TDS5054BE

1MHz,9.2div,5GS/s

sample rate, Sample

acquisition mode

6.8 bits

1MHz,9.2div,10MS/s

sample rate, HiRes acquisi-

tion mode

9.1 bits

TDS5032B, TDS5034B 350 MHz, 6.5 div, 5 GS/s

sample rate, Sample

acquisition mode

6.5 bits

TDS5052B, TDS5054B, TDS5054BE 500 MHz, 6.5 div, 5 GS/s

sample rate, Sample

acquisition mode

6.5 bits

TDS5104B 1MHz,9.2div,5GS/s

sample rate, Sample

acquisition mode

6.6 bits

1MHz,9.2div,10MS/s

sample rate, HiRes acquisi-

tion mode

9.0 bits

1GHz,6.5div,5GS/s

sample rate, Sample

acquisition mode

4.7 bits

Table of Contents3
General Safety Summary7
Product and Feature Description10
- Acquisition Features10
- Table 1- 1: TDS5000B Series Models10
- Display Features11
- Measurement Features12
- Trigger Features12
- Convenience Features12
Table 1- 2: Channel Input and Vertical Specifications14
Specification Tables14
Table 1- 3: Horizontal and Acquisition System Specifications21
Table 1- 4: Trigger Specifications22
Table 1- 5: Display Specifications27
Table 1- 6: Input/Output Port Specifications27
Table 1- 7: Data Storage Specifications28
Table 1- 8: Power Source Specifications29
Table 1- 9: Mechanical Specifications29
Table 1- 10: Environmental Specifications30
Table 1- 11: Certifications and Compliances31
Conventions34
Figure 2- 1: Toolbar and Menu Bar35
Brief Procedures37
Self Tests37
Functional Tests38
- Verify All Input Channels39
- Figure 2- 2: Universal Test Hookup for Functional Tests - CH 1 Shown39
- Figure 2- 3: Channel Button Location40
- Verify the Time Base41
- Figure 2- 4: Setup for Time Base Test41
- Verify the a (Main) and B (Delayed) Trigger Systems43
- Figure 2- 5: Setup for Trigger Test43
- Verify the File System44
- Figure 2- 6: Setup for the File System Test45
- Verify the Internal Printer (Optional)46
- Figure 2- 7: Example Test Page from the Internal Printer47
Performance Tests49
Prerequisites49
Table 2- 1: Test Equipment50
Equipment Required50
TDS5000B Series Test Record52
Signal Acquisition System Checks56
- Check DC Voltage Measurement Accuracy56
- Figure 2- 8: Initial Test Hookup57
- Table 2- 2: DC Voltage Measurement Accuracy58
- Figure 2- 9: Measurement of DC Accuracy at Maximum Offset and Position59
- Check Analog Bandwidth60
- Figure 2- 10: Initial Test Hookup61
- Figure 2- 11: Optional Initial Test Hookup61
- Table 2- 3: Analog Bandwidth62
- Figure 2- 12: Measurement of Analog Bandwidth64
- Figure 2- 13: Initial Test Hookup66
- Figure 2- 14: Measurement of Channel Delay68
- Check Channel Isolation (Crosstalk)69
- Figure 2- 15: Initial Test Hookup69
Figure 2- 16: Initial Test Hookup71
Time Base System Checks71
- Figure 2- 18: Delta Time Accuracy Test Hookup75
- Table 2- 4: Delta Time Measurement77
- Check Time Accuracy for Pulse, Glitch, Timeout, and Width Triggering78
- Figure 2- 18: Initial Test Hookup78
- Figure 2- 19: Measurement of Time Accuracy for Pulse and Glitch Triggering80
- Figure 2- 20: Initial Test Hookup82
- Figure 2- 21: Measurement of Trigger Sensitivity Showing 50 Mhz Results83
Trigger System Checks77
Output Signal Checks87
- Check Outputs87
- Figure 2- 22: Initial Test Hookup87
- Figure 2- 23: Measurement of Main Trigger out Limits89
- Check Probe Compensation Output90
- Figure 2- 24: Initial Test Hookup90
- Figure 2- 25: Measurement of Probe Compensator Frequency91
- Figure 2- 26: Subsequent Test Hookup92
- Figure 2- 27: Measurement of Probe Compensator Amplitude93
Figure 2- -28: Sine Wave Generator Leveling Equipment Setup (Method94
Sine Wave Generator Leveling Procedure94
Figure 2- -29: Sine Wave Generator Leveling Equipment Setup (Method96

Brand	Tektronix
Model	TDS5104B
Category	Test Equipment
Language	English

Tektronix TDS5104B Specification And Performance Verification Technical Reference

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