EasyManuals Logo
Home>Agilent Technologies>Measuring Instruments>E4445A

Agilent Technologies E4445A Manual

Agilent Technologies E4445A
382 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Page #192 background imageLoading...
Page #192 background image
Chapter 4
Front-Panel Key and SCPI Command Reference
Measurement keys
192
Front-Panel Key and SCPI Command
Reference
4.4.4 AM Depth Measurement
The AM Depth measurement consists of 2 views: Numeric Results View and Waveform View.
1. AM Depth Numeric Results View has two windows:
AM Depth Numeric Results Window (upper)
AM Depth Settings Window (lower)
2. AM Depth Demod Waveform View has two windows:
AM Depth Waveform Window (upper)
AM Depth Numeric Results Window (lower)
Table 4-11 AM Depth Numeric Results Window
Name Corresponding Results
AM Depth n=1 1st
AM depth output
Modulation Rate n=1 3rd
Modulation Distortion n=1 4th
Modulation SINAD n=1 5th
Table 4-12 AM Depth Settings Window
Name Corresponding Results
IF BW Type It can be Auto, Manual or Min
IF BW This value is the IF bandwidth set manually
Detector Selection It can be Peak +, Peak -, Peak +/– 2 or RMS
Peak Hold It can be On or Off
HP Filter It can be None, 50 Hz or 300 Hz
LP Filter It can be None, 3 kHz, 15 kHz, 30 kHz or 300 kHz
Table 4-13 AM Depth Waveform Window
Marker Trace Yes
Corresponding Trace AM depth vs. Seconds trace (n=0)

Table of Contents

Other manuals for Agilent Technologies E4445A

Questions and Answers:

Question and Answer IconNeed help?

Do you have a question about the Agilent Technologies E4445A and is the answer not in the manual?

Agilent Technologies E4445A Specifications

General IconGeneral
BrandAgilent Technologies
ModelE4445A
CategoryMeasuring Instruments
LanguageEnglish

Related product manuals