EasyManuals Logo

Analog Devices ADE9000 User Manual

Analog Devices ADE9000
87 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Page #31 background imageLoading...
Page #31 background image
ADE9000 Technical Reference Manual UG-1098
Rev. 0 | Page 31 of 86
V
I
CAPACITIVE:
CURRENT LEADS
VOLTAGE
INDUCTIVE:
CURRENT LAGS
VOLTAGE
WATT
VAR
270° LAGGING
90° LAGGING
INDUCTIVE:
CURRENT LAGS
VOLTAGE
CAPACITIVE:
CURRENT LEADS
VOLTAGE
WA
TT (–)
VAR (+)
QUADRANT II
WA
TT (+)
V
AR (+)
QUADRANT I
W
A
TT (–)
V
AR (–)
QUADRANT III
W
A
TT (+)
VAR (–)
QUADRANT IV
W
A
TT(+) INDICA
TES POWER RECEIVED (IMPORTED FROM GRID)
W
ATT(–) INDIC
A
TES POWER DELIVERED (EXPORTED T
O GRID)
θ
2
= 60° PF
2
= 0.5 IND
θ
1
= –30° PF
1
= 0.866 CA
P
15523-039
Figure 39. Watt and VAR Sign for Capacitive and Inductive Loads
The power factor results is stored in 5.27 format. The highest power
factor value is 0x07FF_FFFF, which corresponds to a power factor
of 1. A power factor of 1 is stored as 0xF800_0000. To determine
the power factor from the xPF register value, use this equation:
Power Factor = APF × 2
27
Total Harmonic Distortion
Total harmonic distortion (THD) is calculated once per second
using total and fundamental rms values, as shown in this
equation:
2
22
AIFRMS
AIFRMSAIRMS
AITHD
=
The THD calculation is stored in signed 5.27 format. The
highest THD value is 0x2000_0000, which corresponds to a
THD of 400%. To obtain the THD value as a percentage, use
this equation:
%THD on Current Channel A = AITHD × 2
27
× 100%
A THD calculation is available on the IA, IB, IC, VA, VB, and VC
channels in the AITHD, BITHD, CITHD, AVTHD, BVTHD, and
CVTHD registers, respectively. Note that a THD measurement is
not available on the IN channel.
TEMPERATURE
The ADE9000 includes a temperature measurement unit that
uses a temperature sensor in conjunction with a 12-bit
successive approximation register (SAR) ADC.
TEMP
SENSOR
AVERAGE
(1,256,512,1024
TSENS_RESULT
12-BIT SAR
15523-040
Figure 40. Temperature Measurement Block Diagram
Enable the temperature sensor by setting the TEMP_EN bit in
the TEMP_CFG register. TEMP_TIME[1:0] allows 1, 256, 512,
or 1024 temperature readings to be averaged, producing a result
after 1.25 ms to 1.3 sec. A temperature acquisition cycle is
started by setting the TEMP_START bit in the TEMP_CFG
register. The result is available in the TEMP_RSLT register. The
TEMP_START bit is self clearing. Set the TEMP_START bit to
obtain a new reading. Set the TEMP_RDY bit in the MASK0
register to receive an interrupt when a new temperature
measurement is available.
The temperature reading offset and gain is measured during
production test and stored in the TEMP_TRIM register. To
convert the temperature readings in TEMP_RSLT into a
temperature in degrees Celsius, use this equation:
Temperature (°C) = TEMP_RSLT × (−TEMP_GAIN/65536) +
(TEMP_OFFSET/32)

Questions and Answers:

Question and Answer IconNeed help?

Do you have a question about the Analog Devices ADE9000 and is the answer not in the manual?

Analog Devices ADE9000 Specifications

General IconGeneral
BrandAnalog Devices
ModelADE9000
CategoryMeasuring Instruments
LanguageEnglish