FISCHER FISCHERSCOPE X-RAY XDLM 237 - Page 2

Operator’s Manual
FISCHERSCOPE
®
X-RAY XDLM
®
231
FISCHERSCOPE
®
X-RAY XDLM
®
232
FISCHERSCOPE
®
X-RAY XDLM
®
237
X-ray fluorescence (EDXRF) measuring instrument
For coating thickness measurements and materials analysis according to the energy dispersive X-
ray fluorescence method
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subsidiary companies around the globe.
© 2015 by Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Germany.
This operator’s manual remains the copyrighted property of Helmut Fischer GmbH. All rights
reserved. This manual may not be reproduced by any means (print, photocopy, microfilm or any
other method) in full or in part, or processed, multiplied or distributed to third parties by electronic
means without the written consent of Helmut Fischer GmbH.
Subject to correction and technical changes.
Document order number: 952-573
Issue date: February 11, 2015
Manufacturer
Helmut Fischer GmbH Phone: +49 (0) 70 31 3 03 - 0
Institut für Elektronik und Messtechnik Fax: +49 (0) 70 31 3 03 - 710
Industriestraße 21 www.helmut-fischer.com
D-71069 Sindelfingen mail@helmut-fischer.de
Quality Assurance System of the Helmut Fischer GmbH
DIN EN ISO 9001:2008 Management system certified by Germanischer Lloyd Systems
Certification
DIN ISO/IEC 17025 Calibration lab accredited for certified mass per unit area
standards