Hioki IR4051 - Appendix A1

A1
Measurement Principles
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1. Insulation resistance measurement
The measurement target’s insulation resistance Rx is
calculated by applying a voltage V to the target, measuring
the leak current I that flows to the target as a result, and
dividing the voltage V by the leak current I.
2. Low resistance measurement
The measurement target’s resistance Rx is calculated by
applying a current I to the measurement target, measuring
the voltage V that occurs between the measurement
terminals as a result, and dividing the voltage V by the
current I.
3. PVΩ measurement
The measurement target’s insulation resistance Rx is
calculated by applying a voltage V to the target, measuring
the leak current I that flows to the target as a result, and
dividing the voltage V by the leak current I.
(Voltage and current generated by the object to be measured
is subtracted.)
Appendix
Measurement Principles
IR4051
IR4052
IR4053
HIOKI IR4051A981-09