HITACHI Deskstar & CinemaStar 7K1000.B & Deskstar E7K1000 Hard Disk Drive specification 
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9.5    SMART Function 
The intent of Self-monitoring, analysis and reporting technology (SMART) is to protect user data and prevent 
unscheduled system downtime that may be caused by predictable degradation and/or fault of the device. By 
monitoring and storing critical performance and calibration parameters, SMART devices employ sophisticated 
data analysis algorithms to predict the likelihood of near-term degradation or fault condition. By alerting the host 
system of a negative reliability status condition, the host system can warn the user of the impending risk of a 
data loss and advise the user of appropriate action. 
 
9.5.1  Attributes 
Attributes are the specific performance or calibration parameters that are used in analyzing the status of the 
device. Attributes are selected by the device manufacturer based on that attribute's ability to contribute to the 
prediction of degrading or faulty conditions for that particular device. The specific set of attributes being used 
and the identity of these attributes is vendor specific and proprietary. 
 
9.5.2  Attribute values 
Attribute values are used to represent the relative reliability of individual performance or calibration attributes. 
The valid range of attribute values is from 1 to 253 decimal. Higher attribute values indicate that the analysis 
algorithms being used by the device are predicting a lower probability of a degrading or faulty condition existing. 
Accordingly, lower attribute values indicate that the analysis algorithms being used by the device are predicting 
a higher probability of a degrading or faulty condition existing.   
 
9.5.3  Attribute thresholds 
Each attribute value has a corresponding attribute threshold limit which is used for direct comparison to the 
attribute value to indicate the existence of a degrading or faulty condition. The numerical values of the attribute 
thresholds are determined by the device manufacturer through design and reliability testing and analysis. Each 
attribute threshold represents the lowest limit to which its corresponding attribute value can be equal while still 
retaining a positive reliability status. Attribute thresholds are set at the device manufacturer's factory and cannot 
be changed in the field. The valid range for attribute thresholds is from 1 through 253 decimal. 
 
9.5.4  Threshold exceeded condition 
If one or more attribute values, whose Pre-failure bit of their status flag is set, are less than or equal to their 
corresponding  attribute  thresholds,  then  the  device  reliability  status  is  negative,  indicating  an  impending 
degrading or faulty condition. 
 
9.5.5  SMART commands 
The SMART commands provide access to attribute values, attribute thresholds and other logging and reporting 
information.