Rev. 2.50 22 June 22, 2017 Rev. 2.50 23 June 22, 2017
HT66F20/HT66F30/HT66F40/HT66F50/HT66F60
HT66FU30/HT66FU40/HT66FU50/HT66FU60
A/D Flash MCU with EEPROM
HT66F20/HT66F30/HT66F40/HT66F50/HT66F60
HT66FU30/HT66FU40/HT66FU50/HT66FU60
A/D Flash MCU with EEPROM
Pin Name Function OP I/T O/T Pin-Shared Mapping
AVDD
ADC power supply* — PWR — —
VSS
Ground** — PWR — —
AVSS
ADC ground** — PWR — —
Note:I/T:Inputtype; O/T:Outputtype
OP:Optionalbycongurationoption(CO)orregisteroption
PWR:Power; CO:Congurationoption; ST:SchmittTriggerinput
CMOS:CMOSoutput; NMOS:NMOSoutput
SCOM:SoftwarecontrolledLCDCOM; AN:Analogsignal
HXT:Highfrequencycrystaloscillator
LXT:Lowfrequencycrystaloscillator
*:VDDisthedevicepowersupplywhileAVDDistheADCpowersupply.TheAVDDpinisbonded
togetherinternallywithVDD.
**:VSSisthedevicegroundpinwhileAVSSistheADCgroundpin.TheAVSSpinisbondedtogether
internallywithVSS.
AsthePinDescriptionSummarytableappliestothepackagetypewiththemostpins,notalloftheabove
listedpinsmaybepresentonpackagetypeswithsmallernumbersofpins.
Absolute Maximum Ratings
SupplyVoltage................................................................................................V
SS
−0.3VtoV
SS
+6.0V
InputVoltage..................................................................................................V
SS
−0.3VtoV
DD
+0.3V
StorageTemperature....................................................................................................-50˚Cto125˚C
OperatingTemperature..................................................................................................-40˚Cto85˚C
I
OH
Total....................................................................................................................................-80mA
I
OL
Total..................................................................................................................................... 80mA
TotalPowerDissipation........................................................................................................ 500mW
Note:Thesearestressratingsonly.Stressesexceedingtherangespecifiedunder"AbsoluteMaximum
Ratings"maycausesubstantialdamagetothesedevices.Functionaloperationofthesedevicesat
otherconditionsbeyondthoselistedinthespecicationisnotimpliedandprolongedexposureto
extremeconditionsmayaffectdevicesreliability.