IBM System/360 2050

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System/3 6 0 Model

2050

Processing Unit

) g 5

Field Engineering

Maintenance

Manual

SY22-2832-4

Main Page

Table of Contents4
Diagnostic Techniques12
Maintenance Philosophy12
- Failure Detection12
- Deferred Maintenance12
Troubleshooting F1Owcharts12
- Power Faults13
- Loading Faults13
- Programming Faults and Error Stops13
Other Maintenance Documentation13
- Error Check Analysis Diagrams13
Service Aids13
- ALD Page Key13
- CAS Logic Diagram Page Key14
- Optional Feature Version Codes14
- Di3Gnostic Mode Codes14
Selector Channel Error Handling16
- Interface Control Check16
- Channel Control Check--Channel Detected16
- Channel Control Checl<--CPU Detected16
- Program, Storage-Protect, and Chaining Check16
- Data Check17
- SIM Check17
- Incorrect Length Indication18
- Error Priority18
Maintenance Features19
CPU Control Modes19
- Sequence Counter Mode19
- Main Store Mode21
- ROS Mode21
Functional Units22
- Sequence Counter22
- Sequence St:rts22
- FLT Op Reg22
- Scan/Log Decoder22
- ROS Kernels22
- Log Trigger33
- Supervisory Stat33
- Progressive Scan Stat33
- Supervisory Enable Storage Stat33
- Binary Trigger33
- Scan Test Counter33
- Pass/Fail Triggers33
Supervisory Controls36
- Clock Gating Control Circuits36
- CPU Control Status Circuits36
- Changing CPU Control Status36
- Supervisory Interrupts36
Linkage Control Word41
Diagnose Instruction41
FAULT LOCATING TESTS (Flt's)42
Fl. T Load43
- Load from Tape43
- Load from Disk46
- Unsuccessful Load46
- Completion of Successful Load46
Main Store Mode Fl. T's46
- MS Mode Hardcore Tests47
- FLT Load Checking Program47
- Test Methods (Mask and Expected Response)47
- MS Mode ROS Bit Tests48
ROS Mode FL T's49
- ROS Mode Hardcore Tests49
- ROS Mode Zero/One-Cycle Tests52
- Zero/One-Cycle Test Methods52
FLT Operating/Repair Procedures54
- Main Storage Ripple Test57
- Skipping Bad FLT Records58
- Disk (FLT) Operating Procedures58
- Cycle Test Repair Procedures (Tape/Disk)59
- Checkout after Repair62
FLT Documentation62
Progressive Scan64
- Test Descriptions64
- Test Patterns72
- Selector Channel Tape or Disk72
- Selector Channel Clock Control72
- Selector Channel Operating Procedure Example73
- Selector Channel Test Documentation73
- Selector Scan Monitor75
- Multiplexor Channel Tape or Disk75
- Multipl75
- Multiplexor Channel Test Documentation75
Diagnostic Programs75
- MIDAS Sense Switches75
- MIDAS Display Codes75
MARGINAL Checklng76
- Nominal Voltages77
- Marginal Voltage Limits77
- Marginal Checking Procedure77
Error Checking77
- Ldentific a Ti on77
- Failure Detection Facilities77
Preventive Maintenance80
- Lamp Test80
- Diagnostics80
Cpu and Channel Service Checks81
- Waveform Measurements81
- 2050 Clock81
Main Storage (Ms) Service Checks81
- Storage Test81
- Main Storage Test Points81
- Main Storage Addressing82
- Main Storage Temperature and Humidity82
- Main Storage Power Information82
- Exercise Bump Storage83
- Continually Address One MS Location83
- Scan MS for Bad Parity83
- Bit Arrangement of MS Word83
- Check Strobe of Main Storage83
- Checking MS Drivers and Terminating Diodes84

IBM System/360 2050 - Page 2

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