SZX2-ILLC16/ILLC10
10
3
Observing the Specimen
A)Observing an IC chip, wafer, etc.
1. Brighten the field of view by turning the quarter-wave plate rotation
annulus.
2. If the field of view is too bright and glaring, adjust the brightness as
described in
2 above.
B)Reflected light polarized observation of liquid crystal, etc.
1. Perform Cross-Nicol observation (with the darkest field of view).
2. For accurate Cross-Nicol adjustment, place a flat, mirror-surfaced speci-
men on the specimen and make the field of view as dark as possible
by turning the quarter-wave plate rotation annulus.
3. Observe the specimen by rotating it on a horizontal plane.
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