Toshiba Satellite A40 Series - Page 130

3.3 Subtest Names 3 Tests and Diagnostics
Table 3-1 Subtest names (2/2)
No. Test Name Subtest No. Subtest Name
6 PRINTER 01
02
03
Ripple pattern
Function
Wrap around
8 HARD DISK 01
02
03
04
05
06
07
09
10
Sequential read
Address uniqueness
Random address/data
Cross talk & peak shift
Partial read
Write specified address
Read specified address
Sequential write
W-R-C specified address
9 REAL TIMER 01
02
03
Real time
Backup memory
Real time carry
10 NDP 01 NDP test
11 EXPANSION 01
03
PCMCIA wraparound
RGB monitor ID
13 CD-ROM/DVD-
ROM
01
02
03
05
Sequential read
Read specified address
Random address/data
RW 1Point W/R/C
14 LAN 01 LAN MAC ADDRESS DISPLAY
Satellite A40 Maintenance Manual (960-458) 3-9