Toshiba Satellite A40 Series - Subtest Names

3 Tests and Diagnostics 3.3 Subtest Names
3.3 Subtest Names
Table 3-1 lists the subtest names for each test program in the DIAGNOSTIC TEST MENU.
Table 3-1 Subtest names (1/2)
No. Test Name Subtest No. Subtest Name
1 SYSTEM 01
02
04
06
07
08
09
ROM checksum
Geyserville
Fan ON/OFF
Quick charge
DMI read
DMI write
Thermister check
2 MEMORY 01
02
06
Conventional memory
Protected mode
Stress
3 KEYBOARD 01
02
04
05
06
07
Pressed key display
Pressed key code display
Touch pad
USB (Port 0, Port 1) test
USB (Port 2, Port 3) test
CD-function key test
4 DISPLAY 01
02
03
04
05
06
07
VRAM read/write for VGA
Gradation for VGA
Gradation for LCD
Gradation & mode test for VGA
All dot on/off for LCD
“H” pattern display
LCD brightness
5 FLOPPY DISK 01
02
03
04
05
Sequential read
Sequential read/write
Random address/data
Write specified address
Read specified address
3-8 Satellite A40 Maintenance Manual (960-458)