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TSI Instruments 3080L - Page 115

TSI Instruments 3080L
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B–16 Series 3080 Electrostatic Classifiers
Kim, J.H., G.W. Mulholland, S.R. Kukuck, and D.Y.H. Pui [2005]
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a Nanometer Differential Mobility Analyzer (Nano-DMA) for
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Kinney, P.D., D.Y.H. Pui, G.W. Mulholland, and N.P. Breyer (1991)
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International Conference, 2:797-800.
Rader, D.J., [1990] “Momentum Slip Correction Factor for Small
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