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Eaton EDR-5000 - Page 683

Eaton EDR-5000
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EDR-5000 IM02602007E
Commissioning: 81U and Rate of Change (f< and -df/dt)
Object to be tested:
All frequency protection stages that are projected as f< and -df/dt.
Necessary means:
Three-phase voltage source and
Frequency generator that can generate and measure a linear, defined rate of change of frequency.
Procedure:
Testing the threshold values
Feed nominal voltage and nominal frequency to the device:
Decrease the frequency below the f< threshold: and
Apply a rate of change of frequency (step change) that is below the setting value (example: apply -1 Hz per
second if the setting value is -0.8 Hz per second). After the tripping delay is expired the relay has to trip.
Successful test result:
Permissible deviations/tolerances and dropout ratios can be taken from the Technical Data.
Commissioning: 81O and Rate of Change (f> and df/dt)
Object to be tested:
All frequency protection stages that are projected as f> and df/dt.
Necessary means:
Three-phase voltage source and
Frequency generator that can generate and measure a linear, defined rate of change of frequency.
Procedure:
Testing the threshold values
Feed nominal voltage and nominal frequency to the device;
Increase the frequency above the f> threshold; and
Apply a rate of change of frequency (step change) that is above the setting value (example: apply 1 Hz per
second if the setting value is 0.8 Hz per second). After the tripping delay is expired the relay has to trip.
Successful test result:
Permissible deviations/tolerances and dropout ratios can be taken from the Technical Data.
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