Table of Contents HIMatrix
Page 4 of 72 HI 800 023 E Rev. 1.01
3.5.2 EU Type Examination.............................................................................................22
4 Central Functions.................................................. 23
4.1 Power Supply Units.............................................................................................. 23
4.2 Functional Description of the Processor System .............................................23
4.3 Self-Tests ..............................................................................................................24
4.3.1 Microprocessor Test...............................................................................................24
4.3.2 Memory Areas Test ................................................................................................ 24
4.3.3 Protected Memory Areas........................................................................................ 24
4.3.4 RAM Test ...............................................................................................................24
4.3.5 Watchdog Test .......................................................................................................24
4.3.6 Test of the I/O Bus Inside the Controller: ...............................................................24
4.3.7 Reactions to Processor System Failures................................................................25
4.4 Fault Diagnosis..................................................................................................... 25
5 Inputs.................................................................... 26
5.1 General .................................................................................................................. 26
5.2 Safety of Sensors, Encoders and Transmitters................................................. 27
5.3 Safety-Related Digital Inputs............................................................................... 27
5.3.1 General...................................................................................................................27
5.3.2 Test Routines ......................................................................................................... 27
5.3.3 Reaction in the Event of a Fault .............................................................................27
5.3.4 Surges on Digital Inputs ......................................................................................... 27
5.3.5 Configurable Digital Inputs ..................................................................................... 28
5.3.6 Line Control ............................................................................................................28
5.4 Safety-Related Analog Inputs (F35, F3 AIO 8/4 01 and F60)............................ 29
5.4.1 General...................................................................................................................29
5.4.2 Test Routines ......................................................................................................... 31
5.4.3 Reaction in the Event of a Fault .............................................................................31
5.5 Safety-Related Counters (F35 and F60)..............................................................32
5.5.1 General...................................................................................................................32
5.5.2 Reaction in the Event of a Fault .............................................................................32
5.6 Checklist for Safety-Related Inputs.................................................................... 32
6 Outputs ................................................................. 33
6.1 General .................................................................................................................. 33
6.2 Safety of Actuators ..............................................................................................34
6.3 Safety-Related Digital Outputs............................................................................ 34
6.3.1 Test Routines for Digital Outputs............................................................................34
6.3.2 Reaction in the Event of a Fault .............................................................................34
6.3.3 Behavior in the Event of External Short-Circuit or Overload ..................................34
6.3.4 Line Control ............................................................................................................34
6.4 Safety-Related Two-Pole Digital Outputs........................................................... 34
6.4.1 Test Routines for Two-Pole Digital Outputs ........................................................... 35
6.4.2 One-Pole/Two-Pole Connection (F3 DIO 8/8 01, F3 DIO 16/8 01): .......................35
6.4.3 Reaction in the Event of a Fault .............................................................................36