HP 4262A User Manual

Model
4262A
Section
III
Figure
3-7
CAUTION
NEVER
APPLY
AN
EXTERNAL
DC
BIAS
OVER
+40V.
4.
Connect
Semiconductor
device
to
test
lead
or
to
fixture.
To
obtain
reliable
meas-
urement
results,
observe
the
following:
Note
a. It is impossible to measure junction capaci-
tance
when
bias
current
flows
through
sample.
b.
If
lead
length
of
device
allows,
it
is
recom-
mended
that
the
device
be
connected
directly
to
UNKNOWN
terminals.
5.
Read
displayed
values.
Loss
factor
of
the
sample
will
be
simultaneously
displayed
on
DQ
DISPLAY.
Note
When using manual trigger, press HOLD/MAN-
UAL
button.
Each
time
the
button
is
pressed,
the
instrument
is
triggered.
When
measuring
multiple
samples
whose
values
are
about
the
same,
it
is
recommended
that
the
LCR
RANGE
be
set
to
MANUAL
and
that
the
range
be
held.
Parameter
Measured
Connections
to
4262A
High
.
.
-+ (+Bias)
Base-collector
junction
X
capacitance
(Cob)-
W
Emitter
current
=
0
(+Bias)
Open Open
Base-
collector
junction
N~
?-itggios)
Lo
capacitance
(Cre)-
a
g
Common
emitter
o
.
100K
GUARD
FOol
GUARD
FET
gate
capacitance
\(‘
{B.as)
(1%ics)
Gpen
Low
High
Open (fgsius)
Open
High
High
High
(+ Bias)
(+Bias)
(+gias)
Open
Low
Diode junction capacitance
e
~
Note:
Hot
carrier
diodes
and
High
®,
Low
Low
High
germanium
diodes
o—L——0
o——»——q+Bias)
sometimes
cannot
Note:
No
bias
should
e
applied.
be
measured.
Figure
3-8.
Semiconductor
Device
Measurement
(Sheet
2
of
2).
3-19

HP 4262A Specifications

General

Brand	HP
Model	4262A
Category	Measuring Instruments
Language	English