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S:\HP8924C\USRGUIDE\BOOK\chapters\opoverv.fb
Chapter 3, Operating Overview
Increasing Measurement Throughput
Reducing delays caused by screen changes
Each time the screen being displayed on the Test Set (active screen) is changed, it
takes approximately 250 ms to access and draw the new screen. Additionally,
each time a field on the active screen is changed it takes a finite amount of time to
update the field. This update time depends on the length and type of field.
When the Test Set is operated remotely, it is possible to display a special “remote
screen.” When the remote screen is displayed, the active screen is never changed.
When the remote screen is being displayed, the Test Set’s display is in the
“locked” state. When the control program on the external controller unlocks the
display, the screen is returned to the last remote screen requested. The *RST
Common Command will place the Test Set’s display screen in the “unlocked”
state. Pressing the [LOCAL] key causes a locked Test Set display session to end
and causes the Test Set’s display screen to return to the unlocked state.
To Lock the Test Set’s Display Screen.
Use the :SPECial:DISPlay ’LOCKED’|’UNLOCKED’ commands to lock and
unlock the Test Set’s display screen.
Syntax
:SPECiaL:DISPlay ’LOCKED’
:SPECiaL:DISPlay ’UNLOCKED’
Example
OUTPUT 714;"SPEC:DISP ’LOCKED’"
locks the Test Set’s display screen.
NOTE: SPECial:DISPlay 'LOCKED'|'UNLOCKED' must not be invoked from the Test Set’s built-in
IBASIC Controller. Executing these commands from an IBASIC program can produce
unexpected results and is not supported.
Reducing measurement setup time
Measurement setup time can be minimized by specifying an instrument operating
state in the BASE register. This approach works in conjunction with SAVE/
RECALL registers to minimize the number of instrument settings that have to
change when recalling an instrument state. Refer to
"Specifying BASE Settings" on
page 64
for a description.
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