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Keysight 34934A - 4 X64 Matrices

Keysight 34934A
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1 Overview of the 34934A
28 Keysight 34934A User’s Guide
4x64 Matrices
4x64 Topology
You can select the 4x64 matrix configuration by setting jumpers on the
appropriate terminal block or configuration block, or by D-Sub wiring.
Once configured for 4x64, the 34934A creates two matrices, each with 256
crosspoint non-latching reed relays organized in a 4-row by 64-column
configuration. You can operate these as two independent 1-wire matrices (MH,
ML) or as a single 2-wire matrix.
In 1-wire operation, the two matrices are:
MH: uses H (high) columns C1H-C64H and H rows R1H-R4H.
ML: uses L (low) columns C1L-C64L and L rows R1L-R4L.
In 2-wire operation, the matrix uses both the H and L columns and rows;
C1H-64H, C1L-C64L, R1H-R4H and R1L-R4L.
As the examples illustrate, no physical matrix configuration changes are required
for 2-wire operation. You wire your test devices between corresponding high and
low matrix terminals or D-Sub pins, then operate the matrix in 2-wire mode by
using SCPI paired commands (e.g. ROUT:OPEN:PAIR).
In either mode of operation, each matrix (MH, ML) is created by jumpering the
rows
on two of the 4x32 relay banks together. To do this, you will either place
physical “CONFIG” jumpers on a terminal or configuration block, or create wiring
jumpers by shorting pins between your D-Sub cables. The row jumpers are shown
on the examples.
Each 32-column bank connects to the other through one 100Ω Row Protection
Resistor (with Bypass Relay) per row. The examples which follow show multiple
ways to connect your DUT and test instrument; each circuit path may include
series resistance, depending on the connection and programmed mode for row
protection (see “Row Protectionon page 15).
A potential application of the 4x64 1-wire topology is to extend one of the 4x64
matrices to an adjacent 4x128 matrix (a second 34934A module) to create a
4x192 (1-wire) matrix with an independent 4x64 (1-wire) matrix.
The 4x64 2-wire topology is optimal for applications where a limited number of
concurrent 2-wire measurements are required over a large number of pins.

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