ating Manual Leica EM TXP 10/10
3. Design and principle of operation
The Leica EM TXP is a unique target preparation device especially developed for
cutting and polishing samples prior to examination by SEM, TEM and LM techniques.
It excels with challenging specimens where pinpointing and preparing barely visible
targets becomes easy. Sawing, milling grinding and polishing exactly to the target is
performed during observation via the stereo microscope. Investigation of the
prepared surface can be done without removing the sample.
The EM TXP is a preparation unit with variable speed from 300 to 20 000 rpm, with
an integrated stereo microscope and ring LED illuminator. A pivot arm and
adjustment assembly holds the specimen carrier for maximum orientation.
It can be used with either milling tools, cut-off wheel or polishing tools.
The area of interest can be centred +/- 2mm and rotated about its longitudinal axis
with the 90° click stop adjustment mechanism. The selected detail remains in the
centre of the field during each operation.
The 90° rotation view allows distance definition i.e. from the front face of the sample.
90° rotational viewing
Processing observation
Front face observation
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