National Instruments PXIe-4467 - AO Gain Flatness Verification

PXIe-4466/4467 Calibration Procedure
© National Instruments Corporation 27
AO Gain Flatness Verification
Test Limits
Table 20: AO Gain Flatness Verification Limits
Device Gain
(dB)
Output Terminal
Configuration
Frequency
As-Found Test Limit
Lower Limit
(V
rms
)
Upper Limit
(V
rms
)
0, 10, 20,
and 30
Differential
1 kHz V
1kHz
20 kHz 0.999079 * V
1kHz
1.000921 * V
1kHz
100 kHz 0.988553 * V
1kHz
1.011579 * V
1kHz
Pseudodifferential
1 kHz V
1kHz
20 kHz 0.999079 * V
1kHz
1.000921 * V
1kHz
100 kHz 0.988553 * V
1kHz
1.011579 * V
1kHz