EasyManua.ls Logo

Proceq Equotip 550 - Page 15

Proceq Equotip 550
52 pages
Print Icon
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
© 2016 Proceq SA 15
3.3.1.5 Selecting the Equotip Leeb Impact Device
For optimized testing of diverse metallic materials and sample geometries, a range of impact devices are available as per “Table 1: Leeb Test Piece
Requirements”.
Type G: Increased impact energy. For solid and inhomogenous
components, e.g. heavy castings and forgings.
Impact energy: 90 Nmm
Type D: Universal unit. For the majority of
your hardness testing requirements.
Impact energy: 11 Nmm
Type C: Reduced impact energy. Surface
hardened components, coatings, thin
walled or impact sensitive components
(small measuring indentation).
Impact energy: 3 Nmm
Type DL: Slim front section.
For measurements in confined spaces, at the
base of grooves or on recessed surfaces.
Impact energy: 11 Nmm
Type DC: Short device. For use in very
confined spaces, e.g. in holes, cylinders or
for internal measurements on assembled
machines. Impact energy: 11 Nmm
Type S: Si3N4 ball indenter. For testing
especially in the very high hardness range
(in excess of 50 HRC / 650 HV): Tool steels
with high carbide content inclusions.
Impact energy: 11 Nmm
Type E: Diamond ball indenter.
For testing in the very high hardness
range (in excess of 50 HRC / 650 HV):
Tool steels with high carbide content
inclusions. More durable than type S.
Impact energy: 11 Nmm
Figure 13: Equotip Leeb Impact Devices
Table of Contents

Other manuals for Proceq Equotip 550

Related product manuals