48 2TLC172001M0211_A
Safety parameters
SIL according to EN 62061/IEC 61508 SIL 3
PL according to EN ISO 13849-1 PL e
Category according to EN ISO 13849-1 4
DCavg according to EN ISO 13849-1 High
CCF according to EN ISO 13849-1 Meets the requirements
HFT (Hardware fault tolerance) 1
SFF (Safe failure fraction) >99% for the single channel parts
>90% for the double channel parts
Charge pump outputs*
PFDAV (for proof test interval = 20 years) 1.1 x 10
-4
PFHD according to EN 62061/IEC 61508 1.5 x 10
-9
MTTFd according to EN ISO 13849-1 High/1500 years
Relay outputs*
PFDAV (for proof test interval = 20 years) 1.5 x 10
-4
PFHD according to EN 62061/IEC 61508 2 x 10
-9
MTTFd according to EN ISO 13849-1 High/1100 years
Analogue inputs* (Pluto D20, D45) 2 sensors (see 4.3.2) 1 sensor (see 4.3.2)
SIL according to EN 62061/IEC 61508 Up to SIL 3 Up to SIL 2
PL according to EN ISO 13849-1 Up to PL e Up to PL d
DCavg according to EN ISO 13849-1 Up to High Up to Medium
PFDAV (for proof test interval = 20 years) 1.5 x 10
-4
1.5 x 10
-3
PFHD according to EN 62061/IEC 61508 1.6 x 10
-9
5.8 x 10
-9
MTTFd according to EN ISO 13849-1 High/1100 years High/400 years
Counter inputs* (Pluto D45) 2 sensors (see 4.4.7) 1 sensor (see 4.4.7)
SIL according to EN 62061/IEC 61508 Up to SIL 3 Up to SIL 1
PL according to EN ISO 13849-1 Up to PL e Up to PL c
DCavg according to EN ISO 13849-1 Up to High Up to High
PFDAV (for proof test interval = 20 years) 1.5 x 10
-4
1.5 x 10
-4
PFHD according to EN 62061/IEC 61508 1.6 x 10
-9
1.6 x 10
-9
MTTFd according to EN ISO 13849-1 High/1100 years High/1100 years
Note:
PFDAV = Average probability of dangerous failure on demand
PFHD = Probability of dangerous failure per hour
MTTFd = Mean time to dangerous failure/channel
PL = Performance level (as defined in EN ISO 13849-1)
CCF = Common cause failure
*Input to output (incl. AS-i and CAN bus)
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