Agilent Technologies 33220A

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Chapter 5 Error Messages
Self-Test Errors
4
5
622 Self-test failed; time base calibration DAC
This error indicates that the time base calibration DAC in the
synthesis IC (U501), or voltage controlled oscillator (U602), has failed.
626 to 629 626: Self-test failed; waveform filter path select relay
627: Self-test failed; -10 dB attenuator path
628: Self-test failed; -20 dB attenuator path
629: Self-test failed; +20 dB amplifier path
These errors indicate that the specified relay is not being properly
switched or the attenuator/amplifier is not providing the expected
attenuation or gain. These self-tests use the internal ADC to verify that
the output path relays, output amplifier (+20 dB), and output
attenuators are operating properly.
630 Self-test failed; internal ADC over-range condition
This error indicates a probable ADC failure. The failure could be of the
system ADC (U703), the ADC input multiplexer (U701), or the ADC
input buffer amplifier (U702).
631 Self-test failed; internal ADC measurement error
This error indicates a probable ADC failure. The failure could be of the
system ADC (U703), the ADC input multiplexer (U701), or the ADC
input buffer amplifier (U702).
632 Self-test failed; square/pulse DAC test failure
This error indicates a probable failure of the square/pulse DAC (U1002).