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Chapter 5 Error Messages
Self-Test Errors
5
Self-Test Errors
The following errors indicate failures that may occur during a self-test.
Refer to the Agilent 33220A Service Guide for more information.
601 Self-test failed; system logic
This error indicates a failure of the main processor (U101), system RAM
(U102), or system ROM (U103).
603 Self-test failed; waveform logic
This error indicates that the waveform logic in the synthesis IC (U501)
has failed.
604 Self-test failed; waveform memory bank
This error indicates that either the waveform RAM (U502) or the
synthesis IC (U501) has failed.
605 Self-test failed; modulation memory bank
This error indicates that the modulation memory bank in the
synthesis IC (U501) has failed.
606 Self-test failed; cross-isolation interface
This error indicates that the cross-isolation interface between the main
processor (U101) and the synthesis IC (U501) has failed, or that the
synthesis IC itself has failed.
616 Self-test failed; pulse phase locked loop
This error indicates that a phase locked loop in the pulse waveform
synthesizer is not correctly locking, and that the frequency of pulse
waveforms (only) may not be correct. Indicates a failure of the synthesis
IC (U501) or associated circuitry.
619 to 621
623 to 625
619: Self-test failed; leading edge DAC
620: Self-test failed; trailing edge DAC
621: Self-test failed; square-wave threshold DAC
623: Self-test failed; dc offset DAC
624: Self-test failed; null DAC
625: Self-test failed; amplitude DAC
These errors indicate a malfunctioning system DAC (U801), failed
DAC multiplexer (U803) channels, or associated circuitry.
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