Agilent Technologies 4156C User Manual

6-26 Agilent 4155C/4156C VXIplug&play Driver User’s Guide, Edition 4
Programming Examples for VEE Users
Multi-Channel Sweep Measurements
Multi-Channel Sweep Measurements
To make multi-channel sweep measurements, use the following functions.
Table 6-10 Functions for Multi-Channel Sweep Measurements
A program example is shown in Figure 6-22 on page 6-27. This program measures
bipolar transistor Ic, Ib-Vbe characteristics. The example uses the User Object of the
Agilent VEE. See Figure 6-23 on page 6-28 and Figure 6-24 on page 6-29. The
measurement setup is shown in Figure 6-21.
Figure 6-21 Device Connection and Source Setup for Example Program
Description Function Parameters
Output Switch Setup hp4156b_setSwitch channel,state
Output Filter Setup hp4156b_setFilter channel,state
Integration Time Setup hp4156b_setInteg table,time,average
Forces dc bias hp4156b_force channel,mode,range,value,compliance,polarity
Sweep Source Setup hp4156b_setIv channel,mode,range,start,stop,point,hold,delay,
s_delay,comp,p_comp
Executes measurement hp4156b_sweepMiv channel[ ],mode[ ],range[ ],point,source[ ],
value[ ], status[ ]
Disables output hp4156b_zeroOutput channel
A
Collector
Base
Emitter
channel: SMU1
mode: V output
value: 0V
range: 2V
comp: 0.1A
polarity: AUTO
channel: SMU2
mode: V output
value: 0V
range: 2V
comp: 0.1A
polarity: AUTO
channel: SMU3
mode: V output
range: 2V
Start: Vstart
Stop: Vstop
point: MeasPoint
hold: 0sec
delay: 0sec
s_delay: 0sec
comp: 0.1A
p_comp: 1W
channel: SMU1
mode: I measure
value: Ic
range: AUTO
status: IcStatus
A
channel: SMU2
mode: I measure
value: Ib
range: AUTO
status: IbStatus

Agilent Technologies 4156C Specifications

General

Brand	Agilent Technologies
Model	4156C
Category	Measuring Instruments
Language	English