Agilent 4155C/4156C VXIplug&play Driver User’s Guide, Edition 4 7-37
Sample Application Programs Using VEE
Customizing Sample Programs
NOTE The modification example shown above changes the meaning of the wafer map
result display as shown below.
P Test results of all devices are within the allowable range.
F1 Device 1 test result is out of the allowable range.
F2 Device 2 test result is out of the allowable range.
F3 Device 3 test result is out of the allowable range.
F4 Test results of device 1 and 2 are out of the allowable range.
F5 Test results of device 2 and 3 are out of the allowable range.
F6 Test results of device 1 and 3 are out of the allowable range.
F7
Test results of all devices are out of the allowable range.
To Add a Measurement Parameter
If you want to add a measurement parameter, such as drain current Id, modify the
program as shown below. This example modifies sample2.vee for device 1 only
(this example does not modify the objects for device 2).
• Adds the measurement function to the Measurement object.
• Adds the object to set the dummy data to the Meas 4155 (Offline) object.
• Adds the object to set the measurement source to the Vth Measurement object.
• Adds the object to save the measured data to the Device 1 Measurement object.
• Modifies the Show Result object and the Main panel display.
Figure 7-24 Id Measurement Setup
A
194
S
SUB
1
4
3
2
OUT
IN
SMU1
SMU2
SMU3
SMU4
4155/4156
E5250A
Cascade Summit series semi-auto prober
0.5V
3.0V
Device1
0V0V
327523
DG
GSD
SUB
Device2
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