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Agilent Technologies E8364C Service Guide

Agilent Technologies E8364C
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Index
Service Guide E8364-90038 Index-17
EMI/RFI
part numbers
, 6-86
ESD
part numbers
, 6-86
support
options, 2-11
organization, 2-11
switch splitter
illustrated, 6-23
operation
, 5-16
part number, 6-22
removal and replacement
illustrated
, 7-45
procedure
, 7-44
troubleshooting
, 4-40
switch, reference transfer
removal and replacement
illustrated
, 7-73
procedure
, 7-72
synthesized source
functional description of, 5-4
system
adjustments, 3-1, 3-38
frequency at 10 MHz
, 3-39
frequency at 3.8 MHz
, 3-40
getting ready, 3-4
LO offset
, 3-43
LO power
, 3-41
phase lock IF gain, 3-46
receiver calibration
, 3-47
source calibration
, 3-45
checks, 3-1
getting ready
, 3-4
cross talk test
, 3-36
operating
recovery
, 8-20
specifications
, 3-6
verification, 3-1, 3-7, 3-19
device connections
, 3-25
dialog box
, 3-24
example of results, 3-27, 3-28
failure flowchart
, 3-26
failure of
, 3-26
getting ready, 3-4
interpreting results
, 3-27
performing
, 3-22
procedure, 3-24
test setup
, 3-24
what it verifies
, 3-19
system motherboard
illustrated, 6-15, 6-19
operation
, 5-30
part number
, 6-14, 6-18
removal and replacement
illustrated
, 7-27
procedure
, 7-26
troubleshooting, 4-11
T
test
calibration coefficients, 3-35
dynamic accuracy, 3-37
frequency accuracy
, 3-32
noise floor
, 3-34
performance
frequency accuracy
, 3-32
source maximum power output
,
3-31
source power accuracy
, 3-30
test port maximum power output
,
3-31
test port power accuracy
, 3-30
receiver compression
, 3-33
source power linearity
, 3-31
system crosstalk
, 3-36
test port crosstalk
, 3-36
test port output power linearity
, 3-31
trace noise
, 3-32
test equipment
required for service, 2-8
required for servicing, 2-8
test port
cable checks
connector repeatability failure
, 3-18
coupler nut
illustrated
, 6-71, 6-73
part number
, 6-70, 6-72
cross talk test, 3-36
dynamic accuracy test
, 3-37
maximum output power test
, 3-31
noise floor test, 3-34
output power accuracy test
, 3-30
output power linearity test
, 3-31
test port 1 coupler
illustrated, 6-23
operation
, 5-17
part number
, 6-22
removal and replacement
illustrated
, 7-51
procedure
, 7-50
troubleshooting, 4-40
test port 2 coupler
illustrated, 6-23
operation
, 5-17
part number, 6-22
removal and replacement
illustrated
, 7-51
procedure, 7-50
troubleshooting
, 4-40
test port cable
checks, 3-10
accessories used in, 3-12
connector repeatability
, 3-17
insertion loss
, 3-14
insertion loss failure, 3-14
magnitude and phase stability
, 3-15
magnitude and phase stability
failure
, 3-16
performing
, 3-12
return loss
, 3-13
return loss failure, 3-13
TEST SET DRIVERS connectors
operation, 5-26
TEST SET I/O
connector
pin assignments, 5-13
rear panel
, 5-12
test set motherboard
illustrated, 6-23
operation
, 5-12
part number
, 6-22
removal and replacement
illustrated
, 7-33
procedure
, 7-32
test setup
system verification, 3-24
tests
adjustments, 3-38
frequency offset group (option 080)
,
4-44
N7840A software, 3-30
performance
, 3-7, 3-30
source group
, 4-31
time domain, Option 010
, 2-3
tools
required for servicing, 2-10
service, part numbers
, 6-84
top assembly, Option 080
replaceable cables
illustrated, 6-21
part numbers
, 6-20
replaceable parts
illustrated
, 6-19
part numbers
, 6-18
top assembly, without Option 080
replaceable parts
part numbers, 6-14
top assembly, without Option 080
replaceable cables
illustrated
, 6-17
part numbers, 6-16
replaceable parts
illustrated
, 6-15
touch screen controller board
removal and replacement
illustrated
, 7-13
procedure
, 7-12
touch screen display
removal and replacement
illustrated
, 7-15
touch screen display assembly
removal and replacement
illustrated, 7-13
procedure
, 7-15

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Agilent Technologies E8364C Specifications

General IconGeneral
BrandAgilent Technologies
ModelE8364C
CategoryMeasuring Instruments
LanguageEnglish

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