Configure the Wafer Reader
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4.4.1 Image Artifacts
Under certain conditions, horizontal lines may be observed in the image (Figure 4-9). These
lines are artifacts of the wafer reader’s optical design. They are most visible at a working
distance of approximately 30.0mm, with a dark field image (most often observed when the
lighting Mode is set to Mode 4 – Mode 9). In most cases, these lines will have no impact on
reading performance. If desired, position the mark in an area of the field of view that is free of
artifacts. To reduce the intensity of the lines, the lighting can be optimized using the
automated tuning process.
Figure 4-9: Image Artifact Example
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