DAKEWE SurePrint S200 - Appendix 5: Electromagnetic Compatibility Indicators

Appendix 5: Electromagnetic Compatibility Indicators
Dakewe (Shenzhen) Medical Equipment Co., Ltd. 85
www.dakewemedical.com
Appendix 5: Electromagnetic Compatibility Indicators
Note:
[Slide Printer] shall meet the emission and immunity requirements specified in
IEC61326-2-6, as shown in the table below.
The user shall be responsible for ensuring the electromagnetic compatibility of the environment for the
equipment to work normally.
It is recommended to evaluate the electromagnetic environment before the equipment is used.
Warning:
[Slide Printer] is designed and tested according to Class A equipment in CISPR 11. In the home
environment, the equipment may cause radio interference, so that protective measures should be taken.
It is prohibited to use the equipment next to an intense radiation source (such as an unshielded RF source),
otherwise the Ordinary operation of the equipment will be affected.
Table I: Electromagnetic emission
Electromagnetic emission
Emission test
Compliance
CISPR 11 conducted emission
Group 1, Class A
CISPR 11 radiated emission
IEC61000-3-2 harmonic emission
N/A
IEC61000-3-3 voltage fluctuation/scintillation
emission
N/A
Table II: Electromagnetic immunity
Electromagnetic immunity
Immunity test items
Basic standards
Test values
Performance
criteria
Electrostatic discharge
(ESD)
IEC61000-4-2
Contact discharge: ± 4 kV
Air discharge: ±2 kV, ± 4 kV, ± 8 kV
B
Radio frequency
electromagnetic field
IEC61000-4-3
80MHz-6.0GHz,3V/m
AM80% 1kHz, step 1%;
Dwell time 1s
A
Pulse cluster
IEC61000-4-4
Power cord: ±1 kV (5/50 ns, 5 kHz)
B
Surge
IEC61000-4-5
Line-to-Earth: ± 1 kV
Line-to-Neutral: ± 0.5 kV
B
Radio frequency
transmission
IEC61000-4-6
Power switch: 3 V, 150 kHz- 80 MHz,
80 %AM
A
Power frequency magnetic
field
IEC61000-4-8
3 A/m, 50/60 Hz
A
Voltage sag and interruption
IEC61000-4-11
0.5 cycle 0%;
1 cycles 0%;
25/30 cycles 70%;
250/300 cycles 0%
B
B
C
C
Performance criteria:
A. In the test, the performance is Ordinary within the specified limit.
B. In the test, the function or performance is degraded or lost temporarily, but can restore automatically.
C. In the test, the function or performance is degraded or lost temporarily, and cannot restore until reference or
system operation by the operator