GE MEDICAL SYSTEMS CT 9800 QUICK SYSTEM
Rev. 3 Direction 18000
8-6-9
8) IOP0 TEST
Description:
This test performs a token bi-directional DMA transfer between public memory and main memory (each
direction). This test also does the main memory sizing that is reported in section 12 of the DEADSTART
list.
Error conditions:
A defective MMC or MAIN MEMORY are the more common causes of this failure. Here is a complete list
of suspect boards when this test fails:
a) IOC card
b) PUBLIC memory card
c) MAIN MEMORY card
d) MMC card
e) Backplane
9) PLS TEST
Description:
This test checks the interface between the SLAVE processor and the PARAMETER LOADER on the
SMP boards. This communication takes place across the public memory bus.
Error conditions:
Failure of this test could be caused by the following:
a) SMP Board
b) RARE - Loss of clock to SMP card from IOC (backpanel or IOC failure)
c) RARE - Hang of the public bus by another card - DASIOP, DGIOP, MASTER, SLAVE, IOC,
BACKPLANE Problems with the SLAVE card will also cause failures of this test, but the self test
portions for the SLAVE card will flag this condition.
10) BPC TEST
Description:
The backprojector subsystem is tested here. This includes not only the BPC card, main memory
interface, and register files but also the ability to access E, L, and H memories on each backprojector
card. A sample backprojection is NOT run in this test.
Error conditions:
A failure if this test indicates that backprojection cannot take place. Failure points are:
a ) BPC
b) BP1 or BP2
c) MMC (backproject data / address path)
d) MAXI
e) RARE - IOC / backpanel
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