Hitachi hard disk drive specifications
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11.18.2.4 Device error count
This field shall contain the total number of errors attributable to the device that have been reported by the device
during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such
as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If
the maximum value for this field is reached the count shall remain at the maximum value when additional errors
are encountered and logged.
11.18.3 Extended Self-test log sector
Table 103 defines the format of each of the sectors that comprise the Extended SMART self-test log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained
in the SMART self-test log, defined in 7.42.6, “Self-test log data structure" on page 228 shall also be included in
the Extended SMART self-test log with all 48-bit entries.
Self-test log data structure revision number
Self-test descriptor index (7:0)
Self-test descriptor index (15:8)
Table 103 Extended Self-test log data structure
These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry
that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces
descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros.
11.18.3.1 Self-test log data structure revision number
The value of this revision number shall be 01h.
11.18.3.2 Self-test descriptor index
This indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero. Valid
values for the Self-test descriptor index are 0 to 18.
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