R&S SMU200A Test Procedures
1007.9845.82 1.45
E-12
Measurement
Settings on DUT:
RF On
Frequency 100 MHz
Level 0 dBm
I/Q Settings menu:
Source Analog Wideband I/Q Input
Crest Factor 3 dB
State On
Setting on signal generator:
Level 0.5 V (Vpeak) corresponding to 4 dBm
Settings on spectrum analyzer
AMPT/REF LEVEL 5 dBm,
SPAN 105 MHz
Vary the frequency from 1 MHz to 50 MHz on the signal generator
and measure sideband levels.
The modulation frequency response is the difference between the
highest and the lowest measured sideband level.
Frequencies: start with 100 MHz, see tabl
e .
Residual Carrier and Leakage
Test equipment Spectrum analyzer (Table 1-2, item 24)
Test setup
Connect the spectrum analyzer to the RF output of the DUT
.
Measurement
S
ettings on DUT:
RF
On
Level 0 dBm, ALC State OFF (S&H)
I/Q Settings menu:
Source Analog Wideband I/Q Input
State Off
Settings on analyzer:
FREQ/CENTER = test frequency, SPAN 1 MHz,
AMPT/REF LEVEL = test level
First measure the unmodulated level as a referenc
e.
T
hen switch on I/Q modulation with open inputs (I/Q Settings menu:
State On) and measure the residual carrier.
The residual carrier in dBc is the level of the residual signal found
referred to the output signal of the DUT without modulation
(dBc = referred to the carrier).
Se
t Impairments State On and Leakage 10% on the DUT.
The residual carrier should increase to 10% (-20 dBc).
Test frequencies: beginning with 10 MHz from tabl
e
To Next Page
Loading...
