R&S SMU200A Test Procedures
1007.9845.82 1.61
E-12
IQ Output, Offset, Wideband Noise
Test equipment Signal analyzer R&S FSQ (table 1-1, pos. 24),
Multimeter (table 1-1, pos. 19)
Test setup
Connect the signal analyzer to the I-output of the DUT
.
Test method First a reference measurement is performed in the menu (Multicarrier
CW) with one carrier at 10 MHz (other carriers at zero). Subsequently, the
noise power (all carriers switched off) is measured at 11 MHz.
Measurement Settings on DUT
Level: 0 dBm
Multi Carrier CW: State ON
Number of Carriers: 2
Carrier Spacing: 20 MHz
Carrier 0 State: Off
Carrier 1 State: On Power Step: 0 dB
Settings on analyzer
FREQ CENTER 10 MHz
SPAN 0 Hz
AMPT/REF LEVEL 5 dBm
BW /RES BW MANUAL 100 kHz
MKR / MARKER 1
Measure carrier at 10 MHz (reference measurement)
Settings on DUT
Carrier 1 State: Off
Settings on analyzer
FREQ CENTER 11 MHz
AMPT/REF LEVEL - 40 dBm
AMPT/RF ATTEN MANUAL 0 dBm
TRACE / DETECTOR RMS
BW /SWEEP TIME MANUAL 50 ms
MKR FCT / NOISE MEAS
Measure the noise power at 11 MHz and calculate the wide
band
noi
s
e.
C
alculation:
Wideband noise = noise power / reference value + 3 dB.
(add +3 dB, as it is sine)
Test setup
Connect the multi meter to the I and Q-output of the DUT.
Measurement Check offset
The number of necessary measurement depends on the number of installed RF- and baseband paths, see
following table:
Installed paths
1 x RF
1 x BB
2 x RF
2 x BB
2 x RF
1 x BB
1 x RF
2 x BB
I/Q output: wideband noise and DC offset
Number of measurements
1 x 2 x 2 x 1 x
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