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C2000 MCU Development Process for Management of Systematic Faults
3 C2000 MCU Development Process for Management of Systematic Faults
For a safety critical development, it is necessary to manage both systematic and random faults. Texas
Instruments has created a unique development process for safety critical semiconductors that greatly
reduce probability of systematic failure. This process builds on a standard quality managed development
as the foundation for safety critical development. The TI MCU teams use this process across all its family
of MCUs that cater to industrial and automotive applications.
3.1 TI Standard Automotive MCU and C2000 MCU Development Process
Texas Instruments has been developing microcontrollers for industrial and automotive markets that require
safety and non-safety applications for over twenty years. Industrial and automotive markets have strong
requirements on quality management and high product reliability. Though not explicitly developed for
compliance to a functional safety standard, the TI standard MCU development process already featured
many elements necessary to manage systematic faults. This development process can be considered to
be Quality Managed (QM), but does not achieve an IEC 61058 Safety Integrity Level (SIL) or ISO 26262
Automotive Safety Integrity Level (ASIL). The TI standard MCU automotive development process is
certified compliant to ISO TS 16949 as assessed by Det Norske Veritas Certification, Inc. (Katy, Texas)
under certificate CERT-07319CC10-2004-AQ-HOU-IATF (IATF certificate No 0113679). The development
is also certified compliant to ISO 9001:2008 as assessed by DNV Certification B.V. (Netherlands) under
Certificate CERT-06185-2003-AQ-HOU-RvA Rev. 2. These standards explicitly apply to TI MCUs (C2000
MCUs, Hercules, TMS570S and RM48x MCUs) that are developed in the same silicon technology nodes.
The standard development process breaks development into phases:
• Business opportunity pre-screen
• Program planning
• Create
• Validate, sample and characterize
• Qualify
• Ramp to production and sustaining production
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SPRUHI3A–April 2013–Revised August 2013 Safety Manual for C2000™ MCUs in IEC60730 Safety Applications
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