Business
Opportunity
Prescreen
ProgramPlanning Create
Validate
Sample
Characterize
Qualify
Ramp/Sustain
DesignIn Team
Sustain
Team
CrossFunctional Team
Identifynew
product
opportunities
Develop
projectplan
ICdesignand
layout
Characterize
Develop
manufacturing
test
Develop&buildmarketingcollateral
Sampleto
customers
Qualification
Buildinitialinventory
Optimizetest
flowandyeilds
Manageprojectrisks(marketandexecution)
Bench& ATE
verification
CP0
Commission
Review
CP1
Design
Kickoff
Review
CP2
PGReview
CP2.5
QualStart
Review
CP3
TMSReview
CP4Safe
Launch
Review
C2000 MCU Development Process for Management of Systematic Faults
www.ti.com
Texas Instruments Incorporated (TI) standard silicon development process is illustrated in Figure 2.
Figure 2. TI Standard MCU Automotive QM Development Process
3.2 C2000 MCU Development Process
The Piccolo and Delfino MCU silicon development process is as per TI MCU development methods and
conforms to ISOTS16949 flow. The goal of the process development is to take the best aspects of each
flow and collaborate to result in best in class capabilities to reduce systematic faults. The process flow is
also targeted for compliance to IEC 61508 as well and is under a process of continuous improvement to
incorporate new features. Piccolo and Delfino series of C2000 MCUs are developed to offer devices with
several temperature grades to address consumer, industrial and automotive applications.
Key elements of the TI MCU process flow are:
• Assumptions on system level design, safety concept, and requirements based on TI's expertise in
safety critical systems development
• Combined qualitative and quantitative or similar safety analysis techniques comprehending the sum of
silicon failure modes and diagnostic techniques known to TI
• Fault estimation based on multiple industry standards as well as TI manufacturing data
• C2000 MCU development process adopts QRASAP00160 new product development processes.
10
Safety Manual for C2000™ MCUs in IEC60730 Safety Applications SPRUHI3A–April 2013–Revised August 2013
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated