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Toshiba e-STUDIO657 - Test print mode (test mode 04)

Toshiba e-STUDIO657
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Test print mode (test mode 04)
Code Types of test pattern Remarks Output for
114 Secondary scanning direction 17 gradation
steps
Error diffusion / gamma adjustment
pattern
SLG
142 Grid pattern Pattern width: 2 dots, Pitch: 10 mm LGC
e-STUIDIO556/656/756/856

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