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turck TBEN-S2-2RFID-4DXP - Using Extended Diagnostics - Time Measurement for Commissioning an Application

turck TBEN-S2-2RFID-4DXP
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Operation
Using extended diagnostics — RFID channels
Hans Turck GmbH & Co. KG | T +49 208 4952-0 | more@turck.com | www.turck.com
07.00 | 2022/09 | 258
9.18.1 Using extended diagnostics — time measurement for commissioning an application
The time of the transmission from the tag to the interface is taken as the time measurement.
The transmission of data to a controller is not taken into account.
If a particular tag is selected in the HF: Select tag type parameter, the time measurement for
the write command is already started when it is activated. The time measurement is carried out
irrespective of whether a tag is present in the detection range. The time measurement function
is available for read/write heads from firmware version Vx.91.
The following values can be displayed for advanced diagnostics and system tests. Actual as well
as minimum and maximum values are available.
n Time in which the Tag present bit is set
n Duration of an inventory command
n Duration of a read command
n Duration of a write command
n Cycle time of HF bus mode
n Cycle time of HF Continuous bus mode
Example: Opening extended diagnostics with the PACTware FDT/DTM frame application
Open diagnostics in PACTware.
Select the RFID channel (here: Channel 0).
a The Expert mode on/off button is displayed in the menu bar.
Activate expert mode.
The time measurement is shown.
Fig.155: Time measurement in the DTM

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