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show the word “READING” and then the display the new value. The new value is
automatically updated in the field and does not allow an escape to the original value or
require that the ENTER key be used to accept the new parameter.
Ramp-HI
The Ramp-HI function is active during the Ramp period only. Ramp-HI will allow
current higher than the normal HI-Limit current setting of the DC Withstand test to
avoid false failure due to charging current.
4.5.3. Insulation Resistance
From the Setup Tests Selection screen, press the “Add”” soft key. The test types soft
keys will now be displayed. From the Setup Tests, Tests Selection screen, press the
“Insulation Resistance” soft key. The Insulation Resistance Parameter Setting screen
will now be displayed. The Insulation Resistance Parameter Setting screen will
appear as follows:
From the Insulation Resistance Parameter Setting screen the following parameters
may be controlled: Voltage, HI-Limit, LO- Limit, Ramp Up, Dwell Time, Delay Time,
Ramp Down, Charge-LO, Scanner Channel, Select Name and Defaults.
Charge–LO
The Charge-LO function is used to check if the cables are connected properly at the
beginning of a test. A capacitive DUT will draw charging current on the DC Withstand
Voltage test when the Output is activated. If the charging current is lower than the
setting, the test cables may not be connected properly.
The instrument can set the Charge-LO parameter manually or automatically. To
manually set the Charge-LO current, use the up and down arrow keys or the ENTER
key and scroll the highlighted area to the Charge-LO current parameter. Enter the
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