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General| Category | Industrial Equipment |
|---|---|
| Manufacturer | Molecular Devices |
| Type | Patch Clamp Amplifier |
| Voltage Clamp | Yes |
| Current Clamp | Yes |
| Capacitance Compensation | Yes |
| Series Resistance Compensation | Yes |
| Bandwidth | 1 MHz |
| Sampling Rate | 500 kHz |
| Operating Modes | Voltage Clamp, Current Clamp |
| Power Requirements | 100-240 VAC |
States the equipment is not intended for human experimentation or application.
Warns that deviation from manufacturer specifications may impair protection.
Covers voltage selection and fuse changing procedures for the instrument.
Details connection, mounting, and assembly for safe operation.
Specifies conditions for safe and optimal instrument operation.
Advises on handling the headstage to prevent static discharge.
States the instrument is tested but researchers should verify accuracy.
Outlines the steps for performing an initial functional checkout.
Guides through single-channel recording using a model cell.
Details adjusting pipette offset for zeroing junction potentials.
Explains using TRACK and V-CLAMP modes for adjustments.
Describes compensating pipette capacitance.
Explains adjustment of the leak subtraction control.
Guides through whole-cell recording using a model cell.
Details cancelling whole-cell capacity transients.
Covers methods for series resistance compensation.
Provides brief and detailed methods for series resistance compensation.
Explains membrane potential and whole-cell current clamp.
Details how to adjust the headstage offset.
Covers frequency boosting, grounding, dimensions, mounting, and cleaning.
Includes static, optical, and acoustic pick-up precautions.
Refers to the headstage tuning procedure.
Describes features of the HL-U pipette holder.
Details holder parts and optional Ag/AgCl pellets.
Describes Blank Activate Input and Capacitance Dither Control.
Covers various input BNCs for commands and testing.
Covers Bridge Mode, Capacitance Measurements, Command Potentials, Seal Test, Current Clamp, Whole-Cell Params, Electrode Comp.
Details the function of the Holding Command control.
Discusses limitations and electrochemical measurement capabilities.
Provides information on the headstage unit.
Details how to adjust the headstage offset.
Covers frequency boosting, grounding, dimensions, mounting, and cleaning.
Includes static, optical, and acoustic pick-up precautions.
Refers to the headstage tuning procedure.
Describes the output filter and gain controls.
Details the Cell Capacitance Telegraph and Data Not Valid outputs.
Covers gain, frequency, and mode telegraph outputs.
Describes Scaled Output and 10Vm Output.
Lists the signals displayed by the panel meter.
Details the instrument's universal voltage input range.
Provides instructions for changing the fuse.
Explains Zap amplitude, duration, and suggested usage.
Provides guidance on grounding and minimizing hum.
Describes the PATCH-1U model cell.
Describes the MCB-1U model bilayer.
Discusses minimizing effects of power supply transients.
Addresses issues with ten-turn potentiometers.
Explains the principles of operation for headstages.
Details the operating principles of headstages.
Explains the principles of resistor feedback in headstages.
Explains the principles of capacitor feedback in headstages.
Covers Zap technique and lipid bilayer experiments.
Details experimental techniques for lipid bilayers.
Discusses the relationship between noise and access resistance.
Defines current and voltage conventions used.
Defines positive, inward, and outward current.
Defines positive potential and transmembrane potential.
Explains depolarizing/hyperpolarizing commands and Vm vs. command potential.
Defines inward and outward current conventions.
Defines series resistance and its effects.
Explains absolute value of series resistance.
Details series resistance correction, prediction, and lag.
Describes controls for series resistance compensation.
Details headstage construction, configuration, gain, and feedback elements.
Covers feedback elements, tuning, and capacitance values.
Specifies case, bandwidth, and capacitive load stability.
Details instrument noise and reset characteristics.
Provides current clamp speed settings and compensation details.
Covers pipette holder and capacitance compensation.
Details series resistance and whole-cell capacitance ranges.
Describes % Prediction, % Correction, and Lag controls.
Details the function of prediction, correction, and lag controls.
Covers capacitance dithering and instrument modes.
Details Zap function and command potentials.
Covers Zap amplitude/duration, Seal Test, and External Commands.
Describes Holding Command and Pipette Offset controls.
Specifies the RMS noise levels.
Covers inputs (Forced Reset, Blank Activate, Speed Test) and outputs.
Details output gain, filters, leak subtraction, and telegraphs.
Lists the necessary equipment for headstage tuning.
Describes gain and offset trim adjustments.
Details frequency tuning for the whole cell configuration.
Explains the procedure for reset transient compensation.
Details the forced reset procedure.
Describes the internal reset procedure.
Provides guidelines for safely packaging the instrument for shipping.
