LYNXEYE XE Detector User Manual
DOC-M88-EXX240 V1 – 03.2014 2-1
2 Introduction
This manual covers installation and basic operation of the LYNXEYE XE detector. The LYNXEYE XE
is a 1-dimensional detector for X-ray powder diffraction, based on Bruker AXS’ compound silicon strip
technology. Compared to a simple point detector the LYNXEYE XE dramatically increases measured
speed – without sacrificing resolution and peak shape. A Diffraction Solution equipped with the LYNX-
EYE XE records a typical powder pattern in approximately 1/100
th
of the time required using a point
detector, with identical data quality.
The LYNXEYE XE is based on the silicon strip detector technology. The active area of the detector is
14.4 mm by 16 mm (along the scattering plane respectively perpendicular). The 192 strips of the sen-
sor act as 192 individual detectors. This technology allows operation at count rates much higher than
those typically possible with gaseous detectors while maintaining all benefits. Together with the inno-
vative front-end electronics, optimum tuning of the silicon strip sensor to the requirements of the X-ray
energy from 4 keV to 25 keV is provided. The factory settings are optimized for Cu-Kα.
The LYNXEYE XE fits to all Bruker AXS D8A25 Diffraction Solutions running under DIF-
FRAC.Measurement Suite. It can be easily exchanged by any other point, linear or 2-dimensional
detector. There is no need for counting gas, cooling water or liquid nitrogen, making the LYNXEYE XE
a compact, robust and maintenance-free detector. With the 2013 release of DIF-
FRAC.MEASUREMENT CENTER, the 1-dim LYNXEYE XE detector is fully supported (0- and 1-
dimensional measurement mode). The 0-dim mode means coupling of several neighboring channels
of the detector to one counting channel. All events collected by the selected channels are counted as
one single rate – equal to how a scintillation counter works. The LYNXEYE XE in 0-dim mode com-
pletely replaces the scintillation counter for many applications, even the basic alignment of the diffrac-
tometer.
Special feature is the good energy resolution of <680eV FWHM for Cu-radiation at 298K (energy reso-
lution slightly depends on environmental laboratory temperature). Operation with all common charac-
teristic X-ray emission lines (Cr, Co, Cu, Mo, and Ag radiation) is supported. A baseline restorer circuit
ensures a stable energy peak position as function of count rate.
Depending on the operation mode, one strip can detect up to ~20,000 cps (high energy resolution) or
~500,000 cps (high count rate), resulting in ~100,000,000 cps in 0-D mode and 90° detector orienta-
tion, count rates are not dead time corrected.
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