Gatan K2 Summit - Figure 1-1. Monte Carlo Simulations of Electron Interaction with Direct and Indirect Camera System

9
all op
e
fabric
a
fi
g
ur
e
A Dir
e
in the
eleme
n
scintil
l
of ele
c
reduci
the pr
i
this b
a
The
m
to use
Direct
camer
a
electr
o
Anoth
distor
t
lenses
The D
noise
o
from
o
counti
The e
l
electr
o
natura
drama
t
frequ
e
K2 Summit
e
rations othe
r
a
tion choices
e
1-1. Mon
t
cam
e
e
ct Detection
sensor’s sup
p
n
t, dramatica
l
l
ato
r
s are use
c
trons from t
h
n
g resolutio
n
i
mary electro
n
a
ckscattering.
m
uch smaller
P
much smalle
r
Detection c
a
a
s as the sig
n
o
n is large rel
er advantage
t
ion, fixed pa
t
.
etective Qua
n
o
f the camer
a
o
ne electron t
o
n
g models a
n
ectron count
i
o
n with a dis
c
l variation in
t
ically lifting
e
ncies.
and K2 Base
r
than the fin
a
which signif
i
t
e Carlo sim
u
e
ra s
y
stem
sensor only
r
p
ort is not de
t
l
ly reducing
t
d. In a first g
e
h
e sensor bul
k
n
. Advanced
D
n
s to pass thr
o
P
SF for a tra
n
r
pixels, 5 μ
m
a
meras have
a
n
al from the n
u
ative to the r
e
of Direct De
t
t
terns, and g
a
n
tum Efficie
n
a
electronics
a
o
the next. T
h
n
d modes; the
i
ng mode of
K
c
rete count. T
h
energy depo
s
the Detectiv
e
Direct
D
etect
i
a
l acquisition
i
cantly incre
a
u
lations of e
l
r
ecords the si
g
t
ected. Silico
n
t
he PSF relati
v
e
neration “b
u
k
back to the
t
D
irect Detect
i
o
ugh the sen
s
n
smission sys
t
m
in case of
K
a
superior sig
n
u
mber of ele
c
e
ad noise of t
h
t
ection is the
a
in variations
n
cy (DQE) o
f
a
nd by large
v
h
is is also tru
e
ir ultimate p
e
K
2 Summit r
e
h
e benefit of
s
ited by elect
r
e
Quantum E
f
i
on Camera
U
of low dose
d
a
se radiation
h
l
ectron inte
r
g
nal deposit
e
n
itself is a re
ve to traditio
n
u
lk” Direct D
e
t
op (active) l
a
i
on sensors, l
i
s
or, with no
“
tem such as
K
K
2, yielding
m
n
al-to-noise
r
c
tron hole pa
i
he sensor ele
c
absence of a
associated w
i
f
traditional c
a
v
ariations in
t
e
for direct d
e
e
rformance is
e
places the a
n
counting is t
h
r
ons impingi
n
fficiency (D
Q
U
ser's Guid
e
d
ata. K2 imp
l
h
ardness.
r
action with
d
e
d in its top l
a
latively low
a
n
al EM cam
e
et
ector there
a
yer, increas
i
i
ke K2, are b
a
“
bulk” suppo
r
K
2 allows a
D
m
any more pi
x
r
atio relative
t
i
rs detected f
r
ctronics.
number of i
m
ith scintillato
a
meras is hel
d
t
he amount o
f
e
tection cam
e
limited by t
h
n
alogue signa
h
at it rejects
r
n
g on the det
e
Q
E) of the de
t
l
ements desi
g
d
irect and in
a
yer; energy
d
a
tomic numb
e
e
ras where ph
is still backs
c
i
ng the PSF a
n
a
ck-thinned
a
r
t and thus m
i
D
irect Detecti
x
els per unit
o
t
o traditional
r
om each pri
m
m
age artifacts
rs and fiber
o
d
back by th
e
f
energy dep
o
e
ras and for
n
h
e noise in th
e
l from each
p
r
ead noise an
d
e
ctor, thereb
y
t
ector across
g
n and
direct
d
eposited
e
r (Z)
h
osphor
c
attering
n
d
a
llowing
i
nimize
on sensor
o
f area.
EM
m
ary
such as
o
ptics or
e
read
o
sited
n
on-
e
system
p
rimary
d
the
y
all spatial