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Hioki IM3536-01 - Measurement Process

Hioki IM3536-01
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6
Measurement process
Measurement process
This section uses AC measurement of a laminated ceramic capacitor as an example to provide an
overview of the instrument’s functionality.
Items to be prepared:
9263 SMD Test Fixture, Laminated ceramic capacity you want to measure
1
Inspect the instrument before measurement. (p. 33)
2
Connect the power cord to the instrument. (p. 34)
3
Turn on the power. (p. 36)
(A 60-minute warm-up period is necessary before performing the correction process de-
scribed in Step 9.)
4
Set the date and time. (p. 38)
5
Connect the 9263 SMD test xture to the measurement terminals.
Overview of connections: p. 35
(The connection method varies with the probes and
xture being used. For more information, see each prod-
uct’s user manual.)
Optional probes and xtures: p. 2
6
Set the measurement mode to LCR. (Default setting: LCR)
2
3
1
Use the CONTINUOUS setting if you wish to take continuous measurements under multiple sets of
conditions. (In LCR mode, you must rst set and save the measurement conditions.)
See “4 Using Continuous Measurement Mode” (p. 93).

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