Deskstar 7K500 and Deskstar E7K500 Hard Disk Drive Specification
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12.42.7 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select
the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents
of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the
ATA generation ATA major revision specifications for byte ordering.
12.42.7.1 Feature flags
The Feature flags define the features of Selective self-test to be executed.
Table 160: Selective self-test log data structure
Description Bytes Offset Read/Write
Data structure revision 2 00h R/W
Starting LBA for test span 1 8 02h R/W
Ending LBA for test span 1 8 0Ah R/W
Starting LBA for test span 2 8 12h R/W
Ending LBA for test span 2 8 1Ah R/W
Starting LBA for test span 3 8 22h R/W
Ending LBA for test span 3 8 2Ah R/W
Starting LBA for test span 4 8 32h R/W
Ending LBA for test span 4 8 3Ah R/W
Starting LBA for test span 5 8 42h R/W
Ending LBA for test span 5 8 4Ah R/W
Reserved 256 52h Reserved
Vendor specific 154 152h Vendor specific
Current LBA under test 8 1ECh Read
Current span under test 2 1F4h Read
Feature flags 2 1F6h R/W
Vendor specific 4 1F8h Vendor specific
Selective self-test pending time 2 1FCh R/W
Reserved 1 1FEh Reserved
Data structure checksum 1 1FFh R/W
512
Bit Description
0 Vendor specific
1 When set to one, perform off-line scan
after selective test.
2 Vendor specific
3 When set to one, off-line scan after
selective test is pending.
4 When set to one, off-line scan after
selective test is active.
5-15 Reserved.
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