AFE1_AFE2-1:1
26
Technical specifications
IAR Debug Probes User Guide
I-jet®, I-jet Trace, and I-scope™
TCK Output Test Clock TCK synchronizes all JTAG transactions. TCK
connects to all JTAG devices in the scan chain. TCK
flows down the stack of modules and connects to
each JTAG device. However, if there is a device in the
scan chain that synchronizes TCK to some other
clock, then all down-stream devices are connected to
the RTCK signal on that processor.
TMS Output Test Mode Select TMS controls transitions in the tap controller state
machine. TMS connects to all JTAG devices in the
scan chain as the signal flows down the module stack.
TDI Output Test Data Input TDI is the test data input signal that is routed to the
TDI input of the first device in the scan chain.
TDO Input Test Data Output TDO is the return path of the test data input signal
TDI. In a multi-device JTAG chain, the TDO of the
first device connects to the TDI of the next device,
etc. The last device's TDO is connected to the TDO
on the JTAG header.
RTCK Input TCK Return RTCK is a mechanism for returning the sampled
clock to the JTAG equipment, so that the clock is not
advanced until the synchronizing device captured the
data. In adaptive clocking mode, I-jet is required to
detect an edge on RTCK before changing TCK. In a
multi-device JTAG chain, the RTCK output from a
device connects to the TCK input of the
down-stream device.
If there are no synchronizing devices in the scan
chain, it is unnecessary to use the RTCK signal and it
is connected to ground on the target board.
VTref Input Voltage Target
Reference
This is the target reference voltage. It indicates that
the target has power. VTref is normally fed from Vdd
on the target hardware and might have a series
resistor (though this is not recommended).
VTref is used by I-jet to detect if target power is
active and to set JTAG signal voltage reference for
level translators.
Pin
I-jet
direction
Name Description
Table 9: ADA-MIPI20-ARM20 adapter pin definitions (Continued)
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